1976 |
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Gershenzon EM, Orlova SL, Orlov LA, Ptitsina NG, Rabinovich RI. Intervalley cyclotron-impurity resonance of electrons in n-Ge. JETP Lett. 1976;24(3):125–8.
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1975 |
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Gershenzon EM, Gurvich YA, Orlova SL, Ptitsina NG. Cyclotron resonance of electrons in Ge in a quantizing magnetic field in the case of inelastic scattering by acoustic phonons. Sov Phys JETP. 1975;40(2):311–5.
Abstract: Results are presented of an experimental study of the linewidth of cyclotron resonance under strong quantization conditions on the scattering of electrons by acoustic phonons. The measurements were performed in the 2....{).4 mm wavelength range at temperatures between 10 and 1.4 OK. A number of singularities were observed in the temperature and frequency dependences of the cyclotron linewidth. These can be ascribed to the effect of inhomogeneous broadening due to nonparabolicity of the electron spectrum, which is renormalized as a result of interaction with acoustic phonons.
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Gershenzon EM, Orlov LA, Ptitsina NG. Absorption spectra in electron transitions between excited states of impurities in germanium. JETP Lett. 1975;22(4):95–7.
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1973 |
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Gershenzon EM, Gol'tsman GN, Ptitsina NG. Submillimeter spectroscopy of semiconductors. Sov Phys JETP. 1973;37(2):299–304.
Abstract: The possibility is considered of carrying out submillimeter-wave spectral investigations of semiconductors by means of a high resolution spectrometer with backward-wave tubes. Results of a study of the excitation spectra of small impurities, D-(A +) centers and free excitons in germanium are presented.
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Gershenzon EM, Gol'tsman G, Ptitsina NG. Energy spectrum of free excitons in germanium. JETP Lett. 1973;18(3):93.
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1972 |
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Bondarenko OI, Gershenzon EM, Gurvich YA, Orlova SL, Ptitsina NG. Measurement of the width of the cyclotron resonance line of n-type Ge in quantizing magnetic fields. Presumably: Sov Phys Semicond | Физика и техника полупроводников. 1972;6:362–3.
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Gershenzon EM, Gol'tsman GN, Ptitsina NG. Observation of the free-exciton spectrum at submillimeter wavelengths. JETP Lett. 1972;16(4):161–2.
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