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  Author Title Year Publication DOI Links
Heeres, R.W.; Dorenbos, S.N.; Koene, B.; Solomon, G.S.; Kouwenhoven, L.P.; Zwiller, V. On-Chip Single Plasmon Detection 2010 Nano Letters 10.1021/nl903761t details   doi
Vetter, A.; Ferrari, S.; Rath, P.; Alaee, R.; Kahl, O.; Kovalyuk, V.; Diewald, S.; Goltsman, G. N.; Korneev, A.; Rockstuhl, C.; Pernice, W. H. P. Cavity-enhanced and ultrafast superconducting single-photon detectors 2016 Nano Lett. 10.1021/acs.nanolett.6b03344 details   doi
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis 2000 Microelectronics Reliability 10.1016/S0026-2714(00)00137-2 details   doi
Korneev, A.; Lipatov, A.; Okunev, O.; Chulkova, G.; Smirnov, K.; Gol’tsman, G.; Zhang, J.; Slysz, W.; Verevkin, A.; Sobolewski, R. GHz counting rate NbN single-photon detector for IR diagnostics of VLSI CMOS circuits 2003 Microelectronic Engineering 10.1016/S0167-9317(03)00309-5 details   doi
Goltsman, G. N.; Shcherbatenko, M. L.; Lobanov, Y. V.; Kovalyuk, V. V.; Kahl, O.; Ferrari, S.; Korneev, A.; Pernice, W. H. P. Superconducting nanowire single photon detector for coherent detection of weak optical signals 2016 LPHYS'16 details   url
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