| |
Author |
Title |
Year |
Publication |
Volume |
Pages |
Links |
|
|
Korneev, Alexander; Golt'sman, Gregory; Pernice, Wolfram |
Photonic integration meets single-photon detection |
2015 |
Laser Focus World |
51 |
47-50 |
|
|
|
Florya, I. N.; Korneeva, Y. P.; Mikhailov, M. Y.; Devizenko, A. Y.; Korneev, A. A.; Goltsman, G. N. |
Photon counting statistics of superconducting single-photon detectors made of a three-layer WSi film |
2018 |
Low Temp. Phys. |
44 |
221-225 |
|
|
|
Goltsman, G. N.; Shcherbatenko, M. L.; Lobanov, Y. V.; Kovalyuk, V. V.; Kahl, O.; Ferrari, S.; Korneev, A.; Pernice, W. H. P. |
Superconducting nanowire single photon detector for coherent detection of weak optical signals |
2016 |
LPHYS'16 |
|
1-2 |
|
|
|
Korneev, A.; Lipatov, A.; Okunev, O.; Chulkova, G.; Smirnov, K.; Gol’tsman, G.; Zhang, J.; Slysz, W.; Verevkin, A.; Sobolewski, R. |
GHz counting rate NbN single-photon detector for IR diagnostics of VLSI CMOS circuits |
2003 |
Microelectronic Engineering |
69 |
274-278 |
|
|
|
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
40 |
1353-1358 |
|
