| 
Citations
 | 
   web
Gershenson, E. M., Gol'tsman, G. N., Elant'ev, A. I., Kagane, M. L., Multanovskii, V. V., & Ptitsina, N. G. (1983). Use of submillimeter backward-wave tube spectroscopy in determination of the chemical nature and concentration of residual impurities in pure semiconductors. Sov. Phys. Semicond., 17(8), 908–913.
toggle visibility
Gershenzon, E. M., Gol'tsman, G. N., Dzardanov, A. L., Elant'ev, A. I., Zorin, M. A., Markin, A. G., et al. (1992). S-N switching of niobium and YBCO films: limit time and perspective of fast key element creation. Sverkhprovodimost': Fizika, Khimiya, Tekhnika, 5(12), 2386–2402.
toggle visibility