| Author |
Title |
Year |
Publication |
DOI |
| Divochiy, Aleksander; Marsili, Francesco; Bitauld, David; Gaggero, Alessandro; Leoni, Roberto; Mattioli, Francesco; Korneev, Alexander; Seleznev, Vitaliy; Kaurova, Nataliya; Minaeva, Olga; Gol'tsman, Gregory; Lagoudakis, Konstantinos G.; Benkhaoul, Moushab; Lévy, Francis; Fiore, Andrea |
Superconducting nanowire photon-number-resolving detector at telecommunication wavelengths |
2008 |
Nat. Photon. |
10.1038/nphoton.2008.51 |
| Takesue, Hiroki; Nam, Sae Woo; Zhang, Qiang; Hadfield, Robert H.; Honjo, Toshimori; Tamaki, Kiyoshi; Yamamoto, Yoshihisa |
Quantum key distribution over a 40-dB channel loss using superconducting single-photon detectors |
2007 |
Nature Photonics |
10.1038/nphoton.2007.75 |
| Pernice, W. H. P.; Schuck, C.; Minaeva, O.; Li, M.; Goltsman, G. N.; Sergienko, A. V.; Tang, H. X. |
High-speed and high-efficiency travelling wave single-photon detectors embedded in nanophotonic circuits |
2012 |
Nat. Commun. |
10.1038/ncomms2307 |
| Marksteiner, M.; Divochiy, A.; Sclafani, M.; Haslinger, P.; Ulbricht, H.; Korneev, A.; Semenov, A.; Gol'tsman, G.; Arndt, M. |
A superconducting NbN detector for neutral nanoparticles |
2009 |
Nanotechnol. |
10.1088/0957-4484/20/45/455501 |
| Sclafani, M.; Marksteiner, M.; Keir, F. M. L.; Divochiy, A.; Korneev, A.; Semenov, A.; Gol'tsman, G.; Arndt, M. |
Sensitivity of a superconducting nanowire detector for single ions at low energy |
2012 |
Nanotechnol. |
10.1088/0957-4484/23/6/065501 |
| Heeres, R.W.; Dorenbos, S.N.; Koene, B.; Solomon, G.S.; Kouwenhoven, L.P.; Zwiller, V. |
On-Chip Single Plasmon Detection |
2010 |
Nano Letters |
10.1021/nl903761t |
| Vetter, A.; Ferrari, S.; Rath, P.; Alaee, R.; Kahl, O.; Kovalyuk, V.; Diewald, S.; Goltsman, G. N.; Korneev, A.; Rockstuhl, C.; Pernice, W. H. P. |
Cavity-enhanced and ultrafast superconducting single-photon detectors |
2016 |
Nano Lett. |
10.1021/acs.nanolett.6b03344 |
| Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
10.1016/S0026-2714(00)00137-2 |
| Korneev, A.; Lipatov, A.; Okunev, O.; Chulkova, G.; Smirnov, K.; Gol’tsman, G.; Zhang, J.; Slysz, W.; Verevkin, A.; Sobolewski, R. |
GHz counting rate NbN single-photon detector for IR diagnostics of VLSI CMOS circuits |
2003 |
Microelectronic Engineering |
10.1016/S0167-9317(03)00309-5 |
| Goltsman, G. N.; Shcherbatenko, M. L.; Lobanov, Y. V.; Kovalyuk, V. V.; Kahl, O.; Ferrari, S.; Korneev, A.; Pernice, W. H. P. |
Superconducting nanowire single photon detector for coherent detection of weak optical signals |
2016 |
LPHYS'16 |
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