Author |
Title |
Year |
Publication |
Volume |
Pages |
Sclafani, M.; Marksteiner, M.; Keir, F. M. L.; Divochiy, A.; Korneev, A.; Semenov, A.; Gol'tsman, G.; Arndt, M. |
Sensitivity of a superconducting nanowire detector for single ions at low energy |
2012 |
Nanotechnol. |
23 |
065501 (1 to 5) |
Heeres, R.W.; Dorenbos, S.N.; Koene, B.; Solomon, G.S.; Kouwenhoven, L.P.; Zwiller, V. |
On-Chip Single Plasmon Detection |
2010 |
Nano Letters |
10 |
661-664 |
Marsili, Francesco; Najafi, Faraz; Dauler, Eric; Bellei, Francesco; Hu, Xiaolong; Csete, Maria; Molnar, Richard J.; Berggren, Karl K. |
Single-photon detectors based on ultranarrow superconducting nanowires |
2011 |
Nano Letters |
11 |
2048–2053 |
Vetter, A.; Ferrari, S.; Rath, P.; Alaee, R.; Kahl, O.; Kovalyuk, V.; Diewald, S.; Goltsman, G. N.; Korneev, A.; Rockstuhl, C.; Pernice, W. H. P. |
Cavity-enhanced and ultrafast superconducting single-photon detectors |
2016 |
Nano Lett. |
16 |
7085-7092 |
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
40 |
1353-1358 |
Korneev, A.; Lipatov, A.; Okunev, O.; Chulkova, G.; Smirnov, K.; Gol’tsman, G.; Zhang, J.; Slysz, W.; Verevkin, A.; Sobolewski, R. |
GHz counting rate NbN single-photon detector for IR diagnostics of VLSI CMOS circuits |
2003 |
Microelectronic Engineering |
69 |
274-278 |
Goltsman, G. N.; Shcherbatenko, M. L.; Lobanov, Y. V.; Kovalyuk, V. V.; Kahl, O.; Ferrari, S.; Korneev, A.; Pernice, W. H. P. |
Superconducting nanowire single photon detector for coherent detection of weak optical signals |
2016 |
LPHYS'16 |
|
1-2 |
Florya, I. N.; Korneeva, Y. P.; Mikhailov, M. Y.; Devizenko, A. Y.; Korneev, A. A.; Goltsman, G. N. |
Photon counting statistics of superconducting single-photon detectors made of a three-layer WSi film |
2018 |
Low Temp. Phys. |
44 |
221-225 |
Korneev, Alexander; Golt'sman, Gregory; Pernice, Wolfram |
Photonic integration meets single-photon detection |
2015 |
Laser Focus World |
51 |
47-50 |
Somani, S.; Kasapi, S.; Wilsher, K.; Lo, W.; Sobolewski, R.; Gol’tsman, G. |
New photon detector for device analysis: Superconducting single-photon detector based on a hot electron effect |
2001 |
J. Vac. Sci. Technol. B |
19 |
2766-2769 |