|
Author |
Title |
Year |
Publication |
DOI |
Links |
|
Sclafani, M.; Marksteiner, M.; Keir, F. M. L.; Divochiy, A.; Korneev, A.; Semenov, A.; Gol'tsman, G.; Arndt, M. |
Sensitivity of a superconducting nanowire detector for single ions at low energy |
2012 |
Nanotechnol. |
10.1088/0957-4484/23/6/065501 |
|
|
Heeres, R.W.; Dorenbos, S.N.; Koene, B.; Solomon, G.S.; Kouwenhoven, L.P.; Zwiller, V. |
On-Chip Single Plasmon Detection |
2010 |
Nano Letters |
10.1021/nl903761t |
|
|
Marsili, Francesco; Najafi, Faraz; Dauler, Eric; Bellei, Francesco; Hu, Xiaolong; Csete, Maria; Molnar, Richard J.; Berggren, Karl K. |
Single-photon detectors based on ultranarrow superconducting nanowires |
2011 |
Nano Letters |
|
|
|
Vetter, A.; Ferrari, S.; Rath, P.; Alaee, R.; Kahl, O.; Kovalyuk, V.; Diewald, S.; Goltsman, G. N.; Korneev, A.; Rockstuhl, C.; Pernice, W. H. P. |
Cavity-enhanced and ultrafast superconducting single-photon detectors |
2016 |
Nano Lett. |
10.1021/acs.nanolett.6b03344 |
|
|
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
10.1016/S0026-2714(00)00137-2 |
|