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Author |
Title |
Year |
Publication |
Volume |
Pages |
Links |
|
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Tong, C.-Y.E.; Meledin, D.V.; Marrone, D.P.; Paine, S.N.; Gibson, H.; Blundell, R. |
Near field vector beam measurements at 1 THz |
2003 |
IEEE Microw. Compon. Lett. |
13 |
235-237 |
|
|
|
Shitov, S. V.; Inatani, J.; Shan, W.-L.; Takeda, M; Wang, Z.; Uvarov, A. V.; Ermakov, A. B.; Uzawa, Y. |
Measurement of emissivity of the ALMA antenna panel at 840 GHz using NbN-based heterodyne SIS receiver |
2008 |
Proc. 19th Int. Symp. Space Terahertz Technol. |
|
263-266 |
|
|
|
Uzawa, Y.; Kojima, T.; Kroug, M.; Takeda, M.; Candotti, M.; Fujii, Y.; Shan, W.-L.; Kaneko, K.; Shitov, S.; Wang, M.-J. |
Development of the 787-950 GHz ALMA band 10 cartridge |
2009 |
Proc. 20th Int. Symp. Space Terahertz Technol. |
|
12-12 |
|
|
|
Li, Chao-Te; Chen, Tse-Jun; Ni, Tong-Liang; Lu, Wei-Chun; Chiu, Chuang-Ping; Chen, Chong-Wen; Chang, Yung-Chin; Wang, Ming-Jye Shi, Sheng-Cai |
Development of SIS mixers for SMA 400-520 GHz band |
2009 |
Proc. 20th Int. Symp. Space Terahertz Technol. |
|
24-30 |
|
|
|
Huebers, Heinz-Wilhelm; Pavlov, S.; Semenov, A.; Köhler, R.; Mahler, L.; Tredicucci, A.; Beere, H.; Ritchie, D.; Linfield, E. |
Terahertz quantum cascade laser as local oscillator in a heterodyne receiver |
2005 |
Optics Express |
13 |
5890-5896 |
|
|
|
de Lange, Gert; Krieg, Jean-Michel; Honingh, Netty; Karpov, Alexandre; Cherednichenko, Sergey |
Performance of the HIFI flight mixers |
2008 |
Proc. 19th Int. Symp. Space Terahertz Technol. |
|
98-105 |
|
|
|
Karpowicz, Nicholas; Lu, Xiaofei; Zhang, X.-C. |
Terahertz gas photonics |
2009 |
J. Modern Opt. |
56 |
1137-1150 |
|
|
|
Jang, Young Rae; Yoo, Keon-Ho; Park, Seung Min |
Rapid thermal annealing of ZnO thin films grown at room temperature |
2010 |
J. Vac. Sci. Technol. A |
28 |
4 |
|
|
|
Tang, Liang; Kocabas, Sukru Ekin; Latif, Salman; Okyay, Ali K.; Ly-Gagnon, Dany-Sebastien; Saraswat, Krishna C.; Miller, David A. B. |
Nanometre-scale germanium photodetector enhanced by a near-infrared dipole antenna |
2008 |
Nature Photonics |
2 |
226-229 |
|
|
|
- |
ГОСТ Р 15.011-96. Патентные исследования. Содержание и порядок проведения |
1996 |
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