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Gershenzon, E. M., Gol'tsman, G. N., Ptitsina, N. G., & Riger, E. R. (1986). Effect of electron-electron collisions on the trapping of free carriers by shallow impurity centers in germanium. Sov. Phys. JETP, 64(4), 889–897.
Abstract: Cascade Auger recombination of free carriers on shallow impurities in Ge is investigated under quasi-equilibrium conditions (T= 2-12 K) and in impurity breakdown. The Auger capture cross sections are found to be a,= 5. 10-l9 T-'n cm2 for donors and uip= 7- T-5p cm2 for acceptors. It is shown that in an isotropic semiconductor (p-Ge) ui is well described by the cascade-capture theory that takes into account only electron-electron collisions. In an anisotropic semiconductor ui is considerably larger (n-Ge, strongly uniaxially compressedp-Ge). Under impurity breakdown conditions the electron-electron collisions determine the lifetimes of the free carriers only in samples with appreciable density of the compensating impurity (Nk loi3 cmP3).
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Gershenzon, E. M., Gol'tsman, G. N., & Ptitsina, N. G. (1972). Observation of the free-exciton spectrum at submillimeter wavelengths. JETP Lett., 16(4), 161–162.
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Gershenson, E. M., Gol'tsman, G. N., Elant'ev, A. I., Kagane, M. L., Multanovskii, V. V., & Ptitsina, N. G. (1983). Use of submillimeter backward-wave tube spectroscopy in determination of the chemical nature and concentration of residual impurities in pure semiconductors. Sov. Phys. Semicond., 17(8), 908–913.
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Gershenzon, E. M., Goltsman, G. N., Multanovskii, V. V., & Ptitsina, N. G. (1982). Kinetics of submillimeter impurity and exciton photoconduction in Ge. Optics and Spectroscopy, 52(4), 454–455.
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Gershenzon, E. M., Gol'tsman, G. N., Multanovskii, V. V., & Ptitsina, N. G. (1981). Cross section for binding of free carriers into excitons in germanium. JETP Lett., 33(11), 574.
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