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Hansen, L., Jørgensen, H. E., Nørgaard-Nielsen, H. U., Pedersen, K., Goudfrooij, P., & Linden-Vornle, M. J. D. (2000). ISO far-infrared observations of rich galaxy clusters III. Abell 2029, Abell 2052, Abell 2142. A&A, 362(1), 133–137.
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Cherednichenko, S., Kroug, M., Yagoubov, P., Merkel, H., Kollberg, E., Yngvesson, K. S., et al. (2000). IF bandwidth of phonon cooled HEB mixers made from NbN films on MgO substrates. In Proc. 11th Int. Symp. Space Terahertz Technol. (pp. 219–227).
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Sergeev, A., & Mitin, V. (2000). Electron-phonon interaction in disordered conductors: Static and vibrating scattering potentials. Phys. Rev. B., 61(9), 6041–6047.
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Leisawitz, D. T., Danchi, W. C., Dipirro, M. J., Feinberg, L. D., Gezari, D. Y., Hagopian, M., et al. (2000). Scientific motivation and technology requirements for the SPIRIT and SPECS far-infrared/submillimeter space interferometers. In Proc. SPIE (Vol. 4013, pp. 36–46).
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Huebers, H. - W., Semenov, A., Schubert, J., Gol’tsman, G. N., Voronov, B. M., Gershenzon, E. M., et al. (2000). NbN hot-electron bolometer as THz mixer for SOFIA. In R. K. Melugin, & H. - P. Roeser (Eds.), Proc. SPIE (Vol. 4014, pp. 195–202). SPIE.
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Gerecht, E., Musante, C. F., Zhuang, Y., Ji, M., Yngvesson, K. S., Goyette, T., et al. (2000). NbN hot electron bolometric mixer with intrinsic receiver noise temperature of less than five times the quantum noise limit. In Proc. IMS (Vol. 2, pp. 1007–1010).
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Kawamura, J., Blundell, R., Tong, C. - Y. E., Papa, D. C., Hunter, T. R., Paine, S. N., et al. (2000). Superconductive hot-electron-bolometer mixer receiver for 800-GHz operation. IEEE Trans. Microw. Theory Techn., 48(4), 683–689.
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Darula, M., Semenov, A. D., Hübers, H. - W., & Schubert, J. (2000). Quasioptical high-Tc superconductor Josephson mixer at terahertz frequencies. In Proc. 11th Int. Symp. Space Terahertz Technol. (515).
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Manus, M. K. M., Kash, J. A., Steen, S. E., Polonsky, S., Tsang, J. C., Knebel, D. R., et al. (2000). PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis. Microelectronics Reliability, 40, 1353–1358.
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Hoevers, H. F. C., Bento, A. C., Bruijn, M. P., Gottardi, L., Korevaar, M. A. N., Mels, W. A., et al. (2000). Thermal fluctuation noise in a voltage biased superconducting transition edge thermometer. Appl. Phys. Lett., 77(26), 4421–4424.
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