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Author Title Year Publication Volume Pages
Hansen, Lene; Jørgensen, H.E.; Nørgaard-Nielsen, Hans Ulrik; Pedersen, Kenneth; Goudfrooij, P.; Linden-Vornle, M.J.D. ISO far-infrared observations of rich galaxy clusters III. Abell 2029, Abell 2052, Abell 2142 2000 Astron. Astrophys. 362 133-137
Cherednichenko, S.; Kroug, M.; Yagoubov, P.; Merkel, H.; Kollberg, E.; Yngvesson, K. S.; Voronov, B.; Gol’tsman, G. IF bandwidth of phonon cooled HEB mixers made from NbN films on MgO substrates 2000 Proc. 11th Int. Symp. Space Terahertz Technol. 219-227
Sergeev, A.; Mitin, V. Electron-phonon interaction in disordered conductors: Static and vibrating scattering potentials 2000 Phys. Rev. B. 61 6041-6047
Leisawitz, David T.; Danchi, William C.; Dipirro, Michael J.; Feinberg, Lee D.; Gezari, Daniel Y.; Hagopian, Mike; Langer, William D.; Mather, John C.; Moseley, Jr. Samuel H.; Shao, Michael; Silverberg, Robert F.; Staguhn, Johannes G.; Swain, Mark R.; Yorke, Harold W.; Zhang, Xiaolei Scientific motivation and technology requirements for the SPIRIT and SPECS far-infrared/submillimeter space interferometers 2000 Proc. SPIE 4013 36-46
Huebers, H.-W.; Semenov, A.; Schubert, J.; Gol’tsman, G. N.; Voronov, B. M.; Gershenzon, E. M.; Krabbe, A.; Roeser, H.-P. NbN hot-electron bolometer as THz mixer for SOFIA 2000 Proc. SPIE 4014 195-202
Gerecht, E.; Musante, C.F.; Zhuang, Y.; Ji, M.; Yngvesson, K.S.; Goyette, T.; Waldman, J. NbN hot electron bolometric mixer with intrinsic receiver noise temperature of less than five times the quantum noise limit 2000 Proc. IMS 2 1007-1010
Kawamura, J.; Blundell, R.; Tong, C.-Y. E.; Papa, D. C.; Hunter, T. R.; Paine, S. N.; Patt, F.; Gol'tsman, G.; Cherednichenko, S.; Voronov, B.; Gershenzon, E. Superconductive hot-electron-bolometer mixer receiver for 800-GHz operation 2000 IEEE Trans. Microw. Theory Techn. 48 683-689
Darula, Marian; Semenov, Alex D.; Hübers, Heinz-Wilhelm; Schubert, Josef Quasioptical high-Tc superconductor Josephson mixer at terahertz frequencies 2000 Proc. 11th Int. Symp. Space Terahertz Technol. 515
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis 2000 Microelectronics Reliability 40 1353-1358
Hoevers, H. F. C.; Bento, A. C.; Bruijn, M. P.; Gottardi, L.; Korevaar, M. A. N.; Mels, W. A.; de Korte, P. A. J. Thermal fluctuation noise in a voltage biased superconducting transition edge thermometer 2000 Applied Physics Letters 77 4421-4424