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Stellari, F., & Song, P. (2005). Testing of ultra low voltage CMOS microprocessors using the superconducting single-photon detector (SSPD). In Proc. 12th IPFA (2). IEEE.
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Galeazzi, M. (2011). Fundamental noise processes in TES devices. IEEE Trans. Appl. Supercond., 21(3), 267–271.
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Manus, M. K. M., Kash, J. A., Steen, S. E., Polonsky, S., Tsang, J. C., Knebel, D. R., et al. (2000). PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis. Microelectronics Reliability, 40, 1353–1358.
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Gorokhov, G., Bychanok, D., Gayduchenko, I., Rogov, Y., Zhukova, E., Zhukov, S., et al. (2020). THz spectroscopy as a versatile tool for filler distribution diagnostics in polymer nanocomposites. Polymers (Basel), 12(12), 3037 (1 to 14).
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Titova, N., Kardakova, A., Tovpeko, N., Ryabchun, S., Mandal, S., Morozov, D., et al. (2017). Superconducting diamond films as perspective material for direct THz detectors. In Proc. 28th Int. Symp. Space Terahertz Technol. (82).
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