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Author Title Year Publication Volume Pages
Stellari, Franco; Song, Peilin Testing of ultra low voltage CMOS microprocessors using the superconducting single-photon detector (SSPD) 2005 Proc. 12th IPFA 2
Galeazzi, Massimiliano Fundamental noise processes in TES devices 2011 IEEE Trans. Appl. Supercond. 21 267-271
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis 2000 Microelectronics Reliability 40 1353-1358
Gorokhov, G.; Bychanok, D.; Gayduchenko, I.; Rogov, Y.; Zhukova, E.; Zhukov, S.; Kadyrov, L.; Fedorov, G.; Ivanov, E.; Kotsilkova, R.; Macutkevic, J.; Kuzhir, P. THz spectroscopy as a versatile tool for filler distribution diagnostics in polymer nanocomposites 2020 Polymers (Basel) 12 3037 (1 to 14)
Titova, N; Kardakova, A.; Tovpeko, N; Ryabchun, S.; Mandal, S.; Morozov, D.; Klemencic, G. M.; Giblin, S.R.; Williams, O. A.; Goltsman, G. N. Superconducting diamond films as perspective material for direct THz detectors 2017 Proc. 28th Int. Symp. Space Terahertz Technol. 82