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Trifonov, V. A., Karasik, B. S., Zorin, M. A., Gol’tsman, G. N., Gershenzon, E. M., Lindgren, M., et al. (1996). 9.6 μm wavelength mixing in a patterned YBa2Cu3O7‐δ thin film. Appl. Phys. Lett., 68(10), 1418–1420.
Abstract: Hot‐electron bolometric (HEB) mixing of 9.6 μm infrared radiation from two lasers in high‐quality YBa2Cu3O7−δ (YBCO) patterned thin film has been demonstrated. A heterodyne measurement showed an intermediate frequency (IF) bandwidth of 18 GHz, limited by our measurement system. An intrinsic limit of 100 GHz is predicted. Between 0.1 and 1 GHz intermediate frequency, temperature fluctuations with an equivalent output noise temperature Tfl up to ∼150 K, contributed to the mixer noise while Johnson noise dominated above 1 GHz. The overall conversion loss at 77 K at low intermediate frequencies was measured to be ∼25 dB, of which 13 dB was due to the coupling loss. The HEB mixer is very promising for use in heterodyne receivers within the whole infrared range.
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Klapwijk, T. M., Barends, R., Gao, J. R., Hajenius, M., & Baselmans, J. J. A. (2004). Improved superconducting hot-electron bolometer devices for the THz range. In Proc. SPIE (Vol. 5498, pp. 129–139).
Abstract: Improved and reproducible heterodyne mixing (noise temperatures of 950 K at 2.5 THz) has been realized with NbN based hot-electron superconducting devices with low contact resistances. A distributed temperature numerical model of the NbN bridge, based on a local electron and a phonon temperature, has been used to understand the physical conditions during the mixing process. We find that the mixing is predominantly due to the exponential rise of the local resistivity as a function of electron temperature.
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Yagoubov, P., Gol'tsman, G., Voronov, B., Svechnikov, S., Cherednichenko, S., Gershenzon, E., et al. (1996). Quasioptical phonon-cooled NbN hot-electron bolometer mixer at THz frequencies. In Proc. 7th Int. Symp. Space Terahertz Technol. (pp. 303–317).
Abstract: In our experiments we tested phonon-cooled hot-electron bolometer (HEB) quasioptical mixer based on spiral antenna designed for 0.5-1.2 THz frequency band and fabricated on sapphire, Si-coated sapphire and high resistivity silicon substrates. HEB devices were produced from thin superconducting NbN film 3.5-6 nm thick with the critical temperature of about 11-12 K. For these devices we achieved the receiver noise temperature T R (DSB) = 3000 K in the 500-700 GHz frequency range and an IF bandwidth of 3-4 GHz. Prelimanary measurements at frequencies 1-1.2 THz resulted the receiver noise temperature about 9000 K (DSB).
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Gerecht, E., Musante, C. F., Zhuang, Y., Ji, M., Yngvesson, K. S., Goyette, T., et al. (2000). NbN hot electron bolometric mixer with intrinsic receiver noise temperature of less than five times the quantum noise limit. In Proc. IMS (Vol. 2, pp. 1007–1010).
Abstract: In recent years, improvements in device development and quasi-optical coupling techniques utilizing planar antennas have led to a significant achievement in low noise receivers for the edges of the submillimeter frequency regime. Hot electron bolometric (HEB) receivers made of thin superconducting films such as NbN have produced a viable option for instruments designed to measure the molecular spectra for astronomical applications as well as in remote sensing of the atmosphere in the THz regime. This paper describes an NbN HEB mixer with intrinsic DSB receiver noise temperature of at most five times the quantum noise limit at frequencies as high as 2.24 THz
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Huard, B., Pothier, H., Esteve, D., & Nagaev, K. E. (2007). Electron heating in metallic resistors at sub-Kelvin temperature. Phys. Rev. B, 76, 165426(1–9).
Abstract: In the presence of Joule heating, the electronic temperature in a metallic resistor placed at sub-Kelvin temperatures can significantly exceed the phonon temperature. Electron cooling proceeds mainly through two processes: electronic diffusion to and from the connecting wires and electron-phonon coupling. The goal of this paper is to present a general solution of the problem in a form that can easily be used in practical situations. As an application, we compute two quantities that depend on the electronic temperature profile: the second and the third cumulant of the current noise at zero frequency, as a function of the voltage across the resistor. We also consider time-dependent heating, an issue relevant for experiments in which current pulses are used, for instance, in time-resolved calorimetry experiments.
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