| Author |
Title |
Year |
Publication |
Volume |
Pages |
| Gerecht, E.; Musante, C.F.; Zhuang, Y.; Ji, M.; Yngvesson, K.S.; Goyette, T.; Waldman, J. |
NbN hot electron bolometric mixer with intrinsic receiver noise temperature of less than five times the quantum noise limit |
2000 |
Proc. IMS |
2 |
1007-1010 |
| Kawamura, J.; Blundell, R.; Tong, C.-Y. E.; Papa, D. C.; Hunter, T. R.; Paine, S. N.; Patt, F.; Gol'tsman, G.; Cherednichenko, S.; Voronov, B.; Gershenzon, E. |
Superconductive hot-electron-bolometer mixer receiver for 800-GHz operation |
2000 |
IEEE Trans. Microw. Theory Techn. |
48 |
683-689 |
| Darula, Marian; Semenov, Alex D.; Hübers, Heinz-Wilhelm; Schubert, Josef |
Quasioptical high-Tc superconductor Josephson mixer at terahertz frequencies |
2000 |
Proc. 11th Int. Symp. Space Terahertz Technol. |
|
515 |
| Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
40 |
1353-1358 |
| Hoevers, H. F. C.; Bento, A. C.; Bruijn, M. P.; Gottardi, L.; Korevaar, M. A. N.; Mels, W. A.; de Korte, P. A. J. |
Thermal fluctuation noise in a voltage biased superconducting transition edge thermometer |
2000 |
Applied Physics Letters |
77 |
4421-4424 |
