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Cherednichenko, S., Khosropanah, P., Berg, T., Merkel, H., Kollberg, E., Drakinskiy, V., et al. (2004). Optimization of HEB mixer for the Herschel Space Observatory. In Proc. 15th Int. Symp. Space Terahertz Technol. (16).
Abstract: A mixer development for the HIFI instrument of the Herschel Space Observatory has come to the final stage. In our paper and conference presentation we will describe the most important details of the Band 6 Low and High Mixer Unit design. Special attention will be given to the optimization of the hot- electron bolometer mixer chip, which is based on 3.5nm NbN superconducting film on silicon. As the HEB’s local oscillator power requirements depend on the bolometer size, we have compared mixer noise temperature for different bolometer width- to- length ratio. A trade- off between mixer performance and local oscillator power requirements results in the mixer units equipped with optimized mixer chips, providing the largest coverage of the Band6 RF band with the lowest possible receiver noise. A short account of the beam pattern measurements of Band6 mixers will be given as well.
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Klaassen, T. O., Hovenier, J. N., Adam, A. J. L., Fischer, J., Jakob, G., Poglitsch, A., et al. (2004). Terahertz calorimetry for the Herschel Space Observatory. In Proc. 29th IRMMW / 12th THz (pp. 815–816).
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Pan, S. K., A. R. Kerr, M. W. P., Lauria, E. F., Crady, W. K., Horner, N., Srikanth, J. S., et al. (2004). A fixed-tuned integrated SIS mixer with ultra-wideband IF and quantum-limited sensitivity for ALMA band 3 (84-116 GHz) receivers. In Proc. 15th Int. Symp. Space Terahertz Technol. (pp. 55–61). Northampton, MA.
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Yorke, H. W., Paine, C. G., Bradford, C. M., Mark Dragovan, Nash, A. E., Dooley, J. A., et al. (2004). Thermal design trades for SAFIR architecture concepts. In Proc. SPIE (Vol. 5487, pp. 1617–1624).
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Ozhegov, R., Morozov, D., Maslennikov, S., Okunev, O., Smirnov, K., & Gol'tsman, G. (2004). Submillimeter wave range imaging system for registering human body radiation and finding out the things covered under clothes. In Proc. 3rd Int. exhibition and conf. Non-Destructive Testing Equipment and Devices. Moscow.
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