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Zhang, W., Khosropanah, P., Gao, J. R., Kollberg, E. L., Yngvesson, K. S., Bansal, T., et al. (2010). Quantum noise in a terahertz hot electron bolometer mixer. Appl. Phys. Lett., 96(11), 111113–(1–3).
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Coumou, P. C. J. J., Driessen, E. F. C., Bueno, J., Chapelier, C., & Klapwijk, T. M. (2013). Electrodynamic response and local tunneling spectroscopy of strongly disordered superconducting TiN films. Phys. Rev. B, 88(18), 180505 (1 to 5).
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Khosropanah, P., Gao, J. R., Laauwen, W. M., Hajenius, M., & Klapwijk, T. M. (2007). Low noise NbN hot electron bolometer mixer at 4.3 THz. Appl. Phys. Lett., 91, 221111 (1 to 3).
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Gao, J. R., Hajenius, M., Yang, Z. Q., Baselmans, J. J. A., Khosropanah, P., Barends, R., et al. (2007). Terahertz superconducting hot electron bolometer heterodyne receivers. IEEE Trans. Appl. Supercond., 17(2), 252–258.
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Baeva, E. M., Sidorova, M. V., Korneev, A. A., Smirnov, K. V., Divochy, A. V., Morozov, P. V., et al. (2018). Thermal properties of NbN single-photon detectors. Phys. Rev. Applied, 10(6), 064063 (1 to 8).
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Baselmans, J. J. A., Baryshev, A., Reker, S. F., Hajenius, M., Gao, J. R., Klapwijk, T. M., et al. (2005). Direct detection effect in small volume hot electron bolometer mixers. Appl. Phys. Lett., 86(16), 163503 (1 to 3).
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Barends, R., Hajenius, M., Gao, J. R., & Klapwijk, T. M. (2005). Current-induced vortex unbinding in bolometer mixers. Appl. Phys. Lett., 87, 263506 (1 to 3).
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Baselmans, J. J. A., Baryshev, A., Hajenius, M., Gao, J. R., Klapwijk, T. M., Voronov, B., et al. (2006). Influence of the direct response on the heterodyne sensitivity of hot electron bolometer mixers. In Proc. 17th Int. Symp. Space Terahertz Technol. (81).
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Baselmans, J. J. A., Baryshev, A., Reker, S. F., Hajenius, M., Gao, J. R., Klapwijk, T. M., et al. (2006). Influence of the direct response on the heterodyne sensitivity of hot electron bolometer mixers. J. Appl. Phys., 100(8), 084510 (1 to 7).
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Finkel, M., Thierschmann, H., Galatro, L., Katan, A. J., Thoen, D. J., de Visser, P. J., et al. (2017). Performance of THz components based on microstrip PECVD SiNx technology. IEEE Trans. THz Sci. Technol., 7(6), 765–771.
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