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Pernice, W. H. P., Schuck, C., Minaeva, O., Li, M., Goltsman, G. N., Sergienko, A. V., et al. (2012). High-speed and high-efficiency travelling wave single-photon detectors embedded in nanophotonic circuits. Nat. Commun., 3, 1325 (1 to 10).
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Averkin, A. S., Shishkin, A. G., Chichkov, V. I., Voronov, B. M., Goltsman, G. N., Karpov, A., et al. (2014). Tunable frequency-selective surface based on superconducting split-ring resonators. In 8th Metamaterials.
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Gershenzon, E. M., Goltsman, G. N., & Orlov, L. (1976). Investigation of population and ionization of donor excited states in Ge. In Physics of Semiconductors (pp. 631–634). North-Holland Publishing Co.
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Ryabchun, S. A., Tretyakov, I. V., Finkel, M. I., Maslennikov, S. N., Kaurova, N. S., Seleznev, V. A., et al. (2008). Fabrication and characterisation of NbN HEB mixers with in situ gold contacts. In Proc. 19th Int. Symp. Space Terahertz Technol. (pp. 62–67). Groningen, Netherlands.
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Gershenzon, E. M., Goltsman, G. N., Semenov, A. D., & Sergeev, A. V. (1989). Limiting characteristic of fast superconducting bolometers. Sov. Phys.-Tech. Phys., 34, 195–199.
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Gershenzon, E. M., Gershenzon, M. E., Goltsman, G. N., Semenov, A. D., & Sergeev, A. V. (1991). Wide-band highspeed Nb and YBaCuO detectors. IEEE Trans. Magn., 27(2), 2836–2839.
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Gershenzon, E. M., Gershenzon, M. E., Goltsman, G. N., Lulkin, A., Semenov, A. D., & Sergeev, A. V. (1990). Electron-phonon interaction in ultrathin Nb films. Sov. Phys. JETP, 70(3), 505–511.
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Tikhonov, V. V., Boyarskii, D. A., Polyakova, O. N., Dzardanov, A. L., & Goltsman, G. N. (2010). Radiophysical and dielectric properties of ore minerals in 12--145 GHz frequency range. PIER B, 25, 349–367.
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Pernice, W., Schuck, C., Li, M., Goltsman, G. N., Sergienko, A. V., & Tang, H. X. (2011). High speed travelling wave single-photon detectors with near-unity quantum efficiency. arXiv, , 1–14.
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Shangina, E. L., Smirnov, K. V., Morozov, D. V., Kovalyuk, V. V., Goltsman, G. N., Verevkin, A. A., et al. (2011). Concentration dependence of energy relaxation time in AlGaAs/GaAs heterojunctions: direct measurements. Semicond. Sci. Technol., 26(2), 025013.
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