| Author |
Title |
Year |
Publication |
Volume |
Pages |
| Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
40 |
1353-1358 |
| Cherednichenko, S.; Rönnung, F.; Gol'tsman, G.; Kollberg, E.; Winkler, D. |
YBa2Cu3O7−δ hot-electron bolometer mixer |
2000 |
Phys. C: Supercond. |
341-348 |
2653-2654 |
| Huebers, H.-W.; Semenov, A.; Schubert, J.; Gol’tsman, G. N.; Voronov, B. M.; Gershenzon, E. M.; Krabbe, A.; Roeser, H.-P. |
NbN hot-electron bolometer as THz mixer for SOFIA |
2000 |
Proc. SPIE |
4014 |
195-202 |
| Darula, Marian; Semenov, Alex D.; Hübers, Heinz-Wilhelm; Schubert, Josef |
Quasioptical high-Tc superconductor Josephson mixer at terahertz frequencies |
2000 |
Proc. 11th Int. Symp. Space Terahertz Technol. |
|
515 |
| Cherednichenko, S.; Rönnung, F.; Gol’tsman, G.; Kollberg, E.; Winkler, D. |
YBa2Cu3O7-δ hot-electron bolometer mixer at 0.6 THz |
2000 |
Proc. 11th Int. Symp. Space Terahertz Technol. |
|
517-522 |
