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Korneev, A.; Divochiy, A.; Tarkhov, M.; Minaeva, O.; Seleznev, V.; Kaurova, N.; Voronov, B.; Okunev, O.; Chulkova, G.; Milostnaya, I.; Smirnov, K.; Gol’tsman, G. Superconducting NbN-nanowire single-photon detectors capable of photon number resolving 2008 Supercond. News Forum details   url
Sidorova, Maria V.; Divochiy, Alexander V.; Vakhtomin, Yury B.; Smirnov, Konstantin V. Ultrafast superconducting single-photon detector with a reduced active area coupled to a tapered lensed single-mode fiber 2015 J. Nanophoton. 9 093051 details   doi
Ozhegov, R.; Elezov, M.; Kurochkin, Y.; Kurochkin, V.; Divochiy, A.; Kovalyuk, V.; Vachtomin, Y.; Smirnov, K.; Goltsman, G. Quantum key distribution over 300 2014 Proc. SPIE 9440 1F (1 to 9) details   doi
Smirnov, K. V.; Vakhtomin, Yu. B.; Divochiy, A. V.; Ozhegov, R. V.; Pentin, I. V.; Slivinskaya, E. V.; Tarkhov, M. A.; Gol’tsman, G. N. Single-photon detectors for the visible and infrared parts of the spectrum based on NbN nanostructures 2009 Proc. Progress In Electromagnetics Research Symp. 863-864 details   url
McCarthy, Aongus; Krichel, Nils J.; Gemmell, Nathan R.; Ren, Ximing; Tanner, Michael G.; Dorenbos, Sander N.; Zwiller, Val; Hadfield, Robert H.; Buller, Gerald S. Kilometer-range, high resolution depth imaging via 1560 nm wavelength single-photon detection 2013 Opt. Express 21 8904-8915 details   doi
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis 2000 Microelectronics Reliability 40 1353-1358 details   doi
Stellari, Franco; Song, Peilin Testing of ultra low voltage CMOS microprocessors using the superconducting single-photon detector (SSPD) 2005 Proc. 12th IPFA 2 details   doi
Marsili, F.; Verma, V. B.; Stern, J. A.; Harrington, S.; Lita, A. E.; Gerrits, T.; Vayshenker, I.; Baek, B.; Shaw, M. D.; Mirin, R. P.; Nam, S. W. Detecting single infrared photons with 93% system efficiency 2013 Nat. Photon. 7 210-214 details   doi
Kitaygorsky, J.; Zhang, J.; Verevkin, A.; Sergeev, A.; Korneev, A.; Matvienko, V.; Kouminov, P.; Smirnov, K.; Voronov, B.; Gol'tsman, G.; Sobolewski, R. Origin of dark counts in nanostructured NbN single-photon detectors 2005 IEEE Trans. Appl. Supercond. 15 545-548 details   doi
Zhang, Jin; Slysz, W.; Verevkin, A.; Okunev, O.; Chulkova, G.; Korneev, A.; Lipatov, A.; Gol'tsman, G. N.; Sobolewski, R. Response time characterization of NbN superconducting single-photon detectors 2003 IEEE Trans. Appl. Supercond. 13 180-183 details   doi
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