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Zhang, J., Slysz, W., Verevkin, A., Okunev, O., Chulkova, G., Korneev, A., et al. (2003). Response time characterization of NbN superconducting single-photon detectors. IEEE Trans. Appl. Supercond., 13(2), 180–183.
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Zinoni, C., Alloing, B., Li, L. H., Marsili, F., Fiore, A., Lunghi, L., et al. (2007). Single-photon experiments at telecommunication wavelengths using nanowire superconducting detectors. Appl. Phys. Lett., 91(3), 031106 (1 to 3).
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Zinoni, C., Alloing, B., Li, L. H., Marsili, F., Fiore, A., Lunghi, L., et al. (2007). Single-photonics at telecom wavelengths using nanowire superconducting single photon detectors. In CLEO/QELS (QTuF6 (1 to 2)). Optical Society of America.
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Zinoni, C., Alloing, B., Li, L. H., Marsili, F., Fiore, A., Lunghi, L., et al. (2010). Erratum: “Single photon experiments at telecom wavelengths using nanowire superconducting detectors” [Appl. Phys. Lett. 91, 031106 (2007)]. Appl. Phys. Lett., 96(8), 089901.
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Zolotov, P., Divochiy, A., Korneeva, Y., Vakhtomin, Y., Seleznev, V., & Smirnov, K. (2015). Capability investigation of superconducting single-photon detectors, optimized for 800–1200 nm spectrum range.
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Zolotov, P., Divochiy, A., Vakhtomin, Y., Moshkova, M., Morozov, P., Seleznev, V., et al. (2018). Photon-number-resolving SSPDs with system detection efficiency over 50% at telecom range. In Proc. AIP Conf. (Vol. 1936, 020019).
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Zolotov, P., Semenov, A., Divochiy, A., & Goltsman, G. (2021). A comparison of VN and NbN thin films towards optimal SNSPD efficiency. IEEE Trans. Appl. Supercond., 31(5), 1–4.
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Zolotov, P., Vakhtomin, Y., Divochiy, A., Morozov, P., Seleznev, V., & Smirnov, K. (2017). Development of fast and high-effective single-photon detector for spectrum range up to 2.3 μm. In Proc. SPBOPEN (pp. 439–440).
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Zolotov, P., Vakhtomin, Y., Divochiy, A., Seleznev, V., Morozov, P., & Smirnov, K. (2013). High-efficiency single-photon detectors based on NbN films.
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Zolotov, P. I., Divochiy, A. V., Vakhtomin, Y. B., Lubenchenko, A. V., Morozov, P. V., Shurkaeva, I. V., et al. (2018). Influence of sputtering parameters on the main characteristics of ultra-thin vanadium nitride films. In J. Phys.: Conf. Ser. (Vol. 1124, 051030).
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