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Tretyakov, I.; Shurakov, A.; Perepelitsa, A.; Kaurova, N.; Svyatodukh, S.; Zilberley, T.; Ryabchun, S.; Smirnov, M.; Ovchinnikov, O.; Goltsman, G. Silicon room temperature IR detectors coated with Ag2S quantum dots 2019 Proc. IWQO 369-371 details   url
Titova, N; Kardakova, A.; Tovpeko, N; Ryabchun, S.; Mandal, S.; Morozov, D.; Klemencic, G. M.; Giblin, S.R.; Williams, O. A.; Goltsman, G. N. Superconducting diamond films as perspective material for direct THz detectors 2017 Proc. 28th Int. Symp. Space Terahertz Technol. 82 details   openurl
Steudle, Gesine A.; Schietinger, Stefan; Höckel, David; Dorenbos, Sander N.; Zadeh, Iman E.; Zwiller, Valery; Benson, Oliver Measuring the quantum nature of light with a single source and a single detector 2012 Phys. Rev. A 86 053814 details   doi
Stellari, Franco; Song, Peilin Testing of ultra low voltage CMOS microprocessors using the superconducting single-photon detector (SSPD) 2005 Proc. 12th IPFA 2 details   doi
Shcherbatenko, Michael; Lobanov, Yury; Finkel, Matvey; Maslennikov, Sergey; Pentin, Ivan; Semenov, Alexander; Titova, Nadezhda; Kaurova, Natalya; Voronov, Boris M.; Rodin, Alexander; Klapwijk, Teunis M.; Gol’tsman, Gregory N. Development of a 30 THz heterodyne receiver based on a hot-electron-bolometer mixer 2014 Proc. 25th Int. Symp. Space Terahertz Technol. 122 details   url
Samsonova, Alena; Zolotov, Philipp; Baeva, Elmira; Lomakin, Andrey; Titova, Nadezhda; Kardakova, Anna; Goltsman, Gregory Signatures of surface magnetic disorder in thin niobium films 2021 IEEE Trans. Appl. Supercond. 1-1 details   doi
Prober, D. E. Superconducting terahertz mixer using a transition-edge microbolometer 1993 Appl. Phys. Lett. 62 2119-2121 details   openurl
Miller, Aaron J.; Lita, Adriana E.; Calkins, Brice; Vayshenker, Igor; Gruber, Steven M.; Nam, Sae Woo Compact cryogenic self-aligning fiber-to-detector coupling with losses below one percent 2011 Optics Express 19 9102-9110 details   openurl
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis 2000 Microelectronics Reliability 40 1353-1358 details   doi
Kooi, Jacob Willem Advanced receivers for submillimeter and far infrared astronomy 2008 University of Groningen details   pdf isbn
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