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Kooi, J. W., Baselmans, J. J. A., Baryshev, A., Schieder, R., Hajenius, M., Gao, J. R., et al. (2006). Stability of heterodyne terahertz receivers. J. Appl. Phys., 100(6), 064904 (1 to 9).
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Korneev, A., Finkel, M., Maslennikov, S., Korneeva, Y., Florya, I., Tarkhov, M., et al. (2010). Superconducting NbN terahertz detectors and infrared photon counters. Вестник НГУ. Серия: физ., 5(4), 68–72.
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Korneev, A. A., Divochiy, A. V., Vakhtomin, Y. B., Korneeva, Y. P., Larionov, P. A., Manova, N. N., et al. (2013). IR single-photon receiver based on ultrathin NbN superconducting film. Rus. J. Radio Electron., (5).
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Korneev, A. A., Korneeva, Y. P., Mikhailov, M. Y., Pershin, Y. P., Semenov, A. V., Vodolazov, D. Y., et al. (2015). Characterization of MoSi superconducting single-photon detectors in the magnetic field. IEEE Trans. Appl. Supercond., 25(3), 2200504 (1 to 4).
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Korneev, A., Minaeva, O., Rubtsova, I., Milostnaya, I., Chulkova, G., Voronov, B., et al. (2005). Superconducting single-photon ultrathin NbN film detector. Quantum Electronics, 35(8), 698–700.
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Korneev, A., Korneeva, Y., Florya, I., Semenov, A., & Goltsman, G. (2018). Photon switching statistics in multistrip superconducting single-photon detectors. IEEE Trans. Appl. Supercond., 28(7), 1–4.
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Korneev, A., Korneeva, Y., Florya, I., Voronov, B., & Goltsman, G. (2012). NbN nanowire superconducting single-photon detector for mid-infrared. Phys. Procedia, 36, 72–76.
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Korneev, A., Korneeva, Y., Manova, N., Larionov, P., Divochiy, A., Semenov, A., et al. (2013). Recent nanowire superconducting single-photon detector optimization for practical applications. IEEE Trans. Appl. Supercond., 23(3), 2201204 (1 to 4).
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Korneev, A., Kouminov, P., Matvienko, V., Chulkova, G., Smirnov, K., Voronov, B., et al. (2004). Sensitivity and gigahertz counting performance of NbN superconducting single-photon detectors. Appl. Phys. Lett., 84(26), 5338–5340.
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Korneev, A., Lipatov, A., Okunev, O., Chulkova, G., Smirnov, K., Gol’tsman, G., et al. (2003). GHz counting rate NbN single-photon detector for IR diagnostics of VLSI CMOS circuits. Microelectronic Engineering, 69(2-4), 274–278.
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