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Verevkin, A.; Zhang, J.; Slysz, W.; Sobolewski, Roman; Lipatov, A.; Okunev, O.; Chulkova, G.; Korneev, A.; Smimov, K.; Gol'tsman, G. N. | ||||
| Title | Spectral sensitivity and temporal resolution of NbN superconducting single-photon detectors | Type | Conference Article | ||
| Year | 2002 | Publication | Proc. 13th Int. Symp. Space Terahertz Technol. | Abbreviated Journal | Proc. 13th Int. Symp. Space Terahertz Technol. |
| Volume | Issue | Pages | 105-111 | ||
| Keywords | NbN SSPD, SNSPD | ||||
| Abstract | We report our studies on spectral sensitivity and time resolution of superconducting NbN thin film single-photon detectors (SPDs). Our SPDs exhibit an everimentally measured detection efficiencies (DE) from — 0.2% at 2=1550 nm up to —3% at lambda=405 nm wavelength for 10-nm film thickness devices and up to 3.5% at lambda=1550 nm for 3.5-nm film thickness devices. Spectral dependences of detection efficiency (DE) at 2=0.4 —3.0 pm range are presented. With variable optical delay setup, it is shown that NbN SPD potentially can resolve optical pulses with the repetition rate up to 10 GHz at least. The observed full width at the half maximum (FWHM) of the signal pulse is about 150-180 ps, limited by read-out electronics. The jitter of NbN SPD is measured to be —35 ps at optimum biasing. | ||||
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| Notes | Approved | no | |||
| Call Number | Serial | 1528 | |||
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| Author |
Verevkin, A. A.; Ptitsina, N. G.; Smirnov, K. V.; Gol’tsman, G. N.; Gershenzon, E. M.; Ingvesson, K. S. | ||||
| Title | Direct measurements of energy relaxation times on an AlGaAs/GaAs heterointerface in the range 4.2–50 K | Type | Journal Article | ||
| Year | 1996 | Publication | JETP Lett. | Abbreviated Journal | JETP Lett. |
| Volume | 64 | Issue | 5 | Pages | 404-409 |
| Keywords | 2DEG, AlGaAs/GaAs heterostructures | ||||
| Abstract | The temperature dependence of the energy relaxation time τe (T) of a two-dimensional electron gas at an AlGaAs/GaAs heterointerface is measured under quasiequilibrium conditions in the region of the transition from scattering by acoustic phonons to scattering with the participation of optical phonons. The temperature interval of constant τe, where scattering by the deformation potential predominates, is determined. In the preceding, low-temperature region, where piezoacoustic and deformation-potential-induced scattering processes coexist, τ e decreases slowly with increasing temperature. Optical phonons start to participate in the scattering processes at T∼25 K (the characteristic phonon lifetime was equal to τLOτ4.5 ps). The energy losses calculated from the τe data in a model with an effective nonequilibrium electron temperature agree with the published data obtained under strong heating conditions. | ||||
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| Series Volume | Series Issue | Edition | |||
| ISSN | 0021-3640 | ISBN | Medium | ||
| Area | Expedition | Conference | |||
| Notes | http://jetpletters.ru/ps/981/article_14955.shtml (“Прямые измерения времен энергетической релаксации на гетерогранице AlGaAs/GaAs в диапазоне 4.2 – 50 К”) | Approved | no | ||
| Call Number | Serial | 1608 | |||
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| Author |
Vasilev, D. D.; Malevannaya, E. I.; Moiseev, K. M.; Zolotov, P. I.; Antipov, A. V.; Vakhtomin, Y. B.; Smirnov, K. V. | ||||
| Title | Influence of deposited material energy on superconducting properties of the WSi films | Type | Conference Article | ||
| Year | 2020 | Publication | IOP Conf. Ser.: Mater. Sci. Eng. | Abbreviated Journal | IOP Conf. Ser.: Mater. Sci. Eng. |
| Volume | 781 | Issue | Pages | 012013 (1 to 6) | |
| Keywords | WSi SSPD, SNSPD | ||||
| Abstract | WSi thin films have the advantages for creating SNSPDs with a large active area or array of detectors on a single substrate due to the amorphous structure. The superconducting properties of ultrathin WSi films substantially depends on their structure and thickness as the NbN films. Scientific groups investigating WSi films mainly focused only on changes of their thickness and the ratio of the components on the substrate at room temperature. This paper presents experiments to determine the effect of the bias potential on the substrate, the temperature of the substrate, and the peak power of pulsed magnetron sputtering, which is the equivalent of ionization, a tungsten target, on the surface resistance and superconducting properties of the WSi ultrathin films. The negative effect of the substrate temperature and the positive effect of the bias potential and the ionization coefficient (peak current) allow one to choose the best WSi films formation mode for SNSPD: substrate temperature 297 K, bias potential -60 V, and peak current 3.5 A. | ||||
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| Series Volume | Series Issue | Edition | |||
| ISSN | 1757-899X | ISBN | Medium | ||
| Area | Expedition | Conference | |||
| Notes | Approved | no | |||
| Call Number | Serial | 1798 | |||
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| Author |
Vakhtomin, Y. B.; Finkel, M. I.; Antipov, S. V.; Smirnov, K. V.; Kaurova, N. S.; Drakinskii, V. N.; Voronov, B. M.; Gol’tsman, G. N. | ||||
| Title | The gain bandwidth of mixers based on the electron heating effect in an ultrathin NbN film on a Si substrate with a buffer MgO layer | Type | Journal Article | ||
| Year | 2003 | Publication | J. of communications technol. & electronics | Abbreviated Journal | J. of communications technol. & electronics |
| Volume | 48 | Issue | 6 | Pages | 671-675 |
| Keywords | NbN HEB mixers | ||||
| Abstract | Measurements of the intermediate frequency band 900 GHz of mixers based on the electron heating effect (EHE) in 2-nm- and 3.5-nm-thick superconducting NbN films sputtered on MgO and Si substrates with buffer MgO layers are presented. A 2-nm-thick superconducting NbN film with a critical temperature of 9.2 K has been obtained for the first time using a buffer MgO layer. | ||||
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| Publisher | MAIK Nauka/Interperiodica, Birmingham, AL | Place of Publication | Editor | ||
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| Series Volume | Series Issue | Edition | |||
| ISSN | 1064-2269 | ISBN | Medium | ||
| Area | Expedition | Conference | |||
| Notes | https://elibrary.ru/item.asp?id=17302119 (Полоса преобразования смесителей на эффекте разогрева электронов в ультратонких пленках NbN на подложках из Si с подслоем MgO) | Approved | no | ||
| Call Number | Vakhtomin2003 | Serial | 1522 | ||
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| Author |
Trifonov, A.; Tong, C.-Y. E.; Grimes, P.; Lobanov, Y.; Kaurova, N.; Blundell, R.; Goltsman, G. | ||||
| Title | Development of A Silicon Membrane-based Multi-pixel Hot Electron Bolometer Receiver | Type | Conference Article | ||
| Year | 2017 | Publication | IEEE Trans. Appl. Supercond. | Abbreviated Journal | IEEE Trans. Appl. Supercond. |
| Volume | 27 | Issue | 4 | Pages | 6 |
| Keywords | Multi-pixel, HEB, silicon-on-insulator, horn array | ||||
| Abstract | We report on the development of a multi-pixel Hot Electron Bolometer (HEB) receiver fabricated using silicon membrane technology. The receiver comprises a 2 × 2 array of four HEB mixers, fabricated on a single chip. The HEB mixer chip is based on a superconducting NbN thin film deposited on top of the silicon-on-insulator (SOI) substrate. The thicknesses of the device layer and handling layer of the SOI substrate are 20 μm and 300 μm respectively. The thickness of the device layer is chosen such that it corresponds to a quarter-wave in silicon at 1.35 THz. The HEB mixer is integrated with a bow-tie antenna structure, in turn designed for coupling to a circular waveguide, |
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| Notes | Approved | no | |||
| Call Number | RPLAB @ kovalyuk @ | Serial | 1111 | ||
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