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Author (down) Samsonova, Alena; Zolotov, Philipp; Baeva, Elmira; Lomakin, Andrey; Titova, Nadezhda; Kardakova, Anna; Goltsman, Gregory
Title Signatures of surface magnetic disorder in thin niobium films Type Journal Article
Year 2021 Publication IEEE Trans. Appl. Supercond. Abbreviated Journal
Volume Issue Pages 1-1
Keywords Temperature measurement, Temperature dependence, Superconducting magnets, Superconducting transition temperature, Substrates, Resistance, Scattering
Abstract We present our studies on the evolution of the normal and superconducting properties with thickness of thin Nb films with a low level of non-magnetic disorder (kFl 150 for the thickest film in the set). The analysis of the superconducting behavior points to the presence of magnetic moments, hidden in the native oxide on the surface of Nb films. Using the Abrikosov-Gorkov theory, we obtain the density of surface magnetic moments of 1013 cm-2, which is in agreement with the previously reported data for Nb films.
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ISSN 1051-8223 ISBN Medium
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Notes Approved no
Call Number Serial 1162
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Author (down) Prober, D. E.
Title Superconducting terahertz mixer using a transition-edge microbolometer Type Journal Article
Year 1993 Publication Appl. Phys. Lett. Abbreviated Journal Appl. Phys. Lett.
Volume 62 Issue 17 Pages 2119-2121
Keywords HEB mixer, NbN, TES
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Notes Recommended by Klapwijk Approved no
Call Number Serial 244
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Author (down) Miller, Aaron J.; Lita, Adriana E.; Calkins, Brice; Vayshenker, Igor; Gruber, Steven M.; Nam, Sae Woo
Title Compact cryogenic self-aligning fiber-to-detector coupling with losses below one percent Type Journal Article
Year 2011 Publication Optics Express Abbreviated Journal Opt. Express
Volume 19 Issue 10 Pages 9102-9110
Keywords TES
Abstract We present a compact packaging technique for coupling light from a single-mode telecommunication fiber to cryogenic single-photon sensitive devices. Our single-photon detectors are superconducting transition-edge sensors (TESs) with a collection area only a factor of a few larger than the area of the fiber core which presents significant challenges to low-loss fiber-to-detector coupling. The coupling method presented here has low loss, cryogenic compatibility, easy and reproducible assembly and low component cost. The system efficiency of the packaged single-photon counting detectors is verified by the “triplet method” of power-source calibration along with the “multiple attenuator” method that produces a calibrated single-photon flux. These calibration techniques, when used in combination with through-wafer imaging and fiber back-reflection measurements, give us confidence that we have achieved coupling losses below 1 % for all devices packaged according to the self-alignment method presented in this paper.
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Notes Approved no
Call Number RPLAB @ gujma @ Serial 666
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Author (down) Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W.
Title PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis Type Journal Article
Year 2000 Publication Microelectronics Reliability Abbreviated Journal Microelectronics Reliability
Volume 40 Issue Pages 1353-1358
Keywords SSPD, CMOS testing
Abstract Normal operation of complementary metal-oxide semiconductor (CMOS) devices entails the emission of picosecond pulses of light, which can be used to diagnose circuit problems. The pulses that are observed from submicron sized field effect transistors (FETs) are synchronous with logic state switching. Picosecond Imaging Circuit Analysis (PICA), a new optical imaging technique combining imaging with timing, spatially resolves individual devices at the 0.5 micron level and switching events on a 10 picosecond timescale. PICA is used here for the diagnostics of failures on two VLSI microprocessors.
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Notes Approved no
Call Number Serial 1054
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Author (down) Kooi, Jacob Willem
Title Advanced receivers for submillimeter and far infrared astronomy Type Book Whole
Year 2008 Publication University of Groningen Abbreviated Journal RUG
Volume Issue Pages
Keywords HEB, SIS, TES, NEP, noise temperature, IF bandwidth, waveguide, impedance, conversion gain, FTS, integrated array, stability, Allan variance, multi-layer antireflection coating
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Corporate Author Thesis Doctoral thesis
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ISSN ISBN 978-90-367-3653-4 Medium
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Notes Approved no
Call Number Serial 881
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