Stucki, D., Walenta, N., Vannel, F., Thew, R. T., Gisin, N., Zbinden, H., et al. (2009). High rate long-distance quantum key distribution over 250 km of ultra low loss fibres. New J. Phys., 11(7), 075003.
Abstract: We present a fully automated quantum key distribution prototype running at 625 MHz clock rate. Taking advantage of ultra low loss fibres and low-noise superconducting detectors, we can distribute 6,000 secret bits per second over 100 km and 15 bits per second over 250km.
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Stevens, M., Hadfield, R., Schwall, R., Nam, S. W., Mirin, R., & Gupta, J. (2006). Fast lifetime measurements of infrared emitters using a low-jitter superconduct- ing single-photon detector. Appl. Phys. Lett., 89, 031109.
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Stevens, M., Hadfeld, R., Schwall, R., Nam, S. W., & and Mirin, R. (2006). Quantum dot single photon sources studied with superconducting single photon detectors. IEEE J. Sel. Topics Quantum Electron., 12(6), 1255–1267.
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Steudle, G. A., Schietinger, S., Höckel, D., Dorenbos, S. N., Zadeh, I. E., Zwiller, V., et al. (2012). Measuring the quantum nature of light with a single source and a single detector. Phys. Rev. A, 86(5), 053814.
Abstract: An elementary experiment in optics consists of a light source and a detector. Yet, if the source generates nonclassical correlations such an experiment is capable of unambiguously demonstrating the quantum nature of light. We realized such an experiment with a defect center in diamond and a superconducting detector. Previous experiments relied on more complex setups, such as the Hanbury Brown and Twiss configuration, where a beam splitter directs light to two photodetectors, creating the false impression that the beam splitter is a fundamentally required element. As an additional benefit, our results provide a simplification of the widely used photon-correlation techniques.
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Stellari, F., & Song, P. (2005). Testing of ultra low voltage CMOS microprocessors using the superconducting single-photon detector (SSPD). In Proc. 12th IPFA (2). IEEE.
Abstract: In F. Stellari and P. Song (2004) the authors have shown a comparison among different detectors used for diagnosing integrated circuits (ICs) by means of the PICA method. In their experiments they used two versions of the SSPD detector (p-SSPD is a prototype version, while c-SSPD is the first commercially available generation of the detector as presented in W. K. Lo et al. (2002), as well as the imaging detector (S-25 photo-multiplier tube (PMT) as discussed in W. G. McMullan (1987)) used in the conventional PICA technique. A microprocessor chip fabricated in a 0.13 μm 1.2 V technology is used to show that c-SSPD provides a significant reduction in acquisition time for the collection of optical waveforms from chips running at very low. In this paper, the authors summarize the main results.
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