| Home | << 1 >> |
|
| Author | Title | Year | Publication | DOI |
|---|---|---|---|---|
| Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. | PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis | 2000 | Microelectronics Reliability | 10.1016/S0026-2714(00)00137-2 |