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Gundlach, K. H., & Schicke, M. (2000). SIS and bolometer mixers for terahertz frequencies. Supercond. Sci. Technol, 13, 181–187.
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Кардашев, Н. С., Андреянов, В. В., Буякас, В. И., Виноградов, И. С., Гвамичева, А. С., Котик, А. И., et al. (2000). Проект Миллиметрон. Труды ФИАН им. Лебедева, 228.
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Kardashev, N. S., Andreyanov, V. V., Buyakas, V. I., Vinogradov, I. S., Gvamichava, A. S., Kotik, A. I., et al. (2000). The Millimetron project. In Proc. Lebedev Phys. Institute (Vol. 228).
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Kawamura, J., Blundell, R., Tong, C. - Y. E., Papa, D. C., Hunter, T. R., Paine, St. N., et al. (2000). Superconductive hot-electron bolometer mixer receiver for 800 GHz operation (Vol. 48).
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Hansen, L., Jørgensen, H. E., Nørgaard-Nielsen, H. U., Pedersen, K., Goudfrooij, P., & Linden-Vornle, M. J. D. (2000). ISO far-infrared observations of rich galaxy clusters III. Abell 2029, Abell 2052, Abell 2142. A&A, 362(1), 133–137.
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Kawamura, J., Blundell, R., Tong, C. - Y. E., Papa, D. C., Hunter, T. R., Paine, S. N., et al. (2000). Superconductive hot-electron-bolometer mixer receiver for 800-GHz operation. IEEE Trans. Microw. Theory Techn., 48(4), 683–689.
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Hoevers, H. F. C., Bento, A. C., Bruijn, M. P., Gottardi, L., Korevaar, M. A. N., Mels, W. A., et al. (2000). Thermal fluctuation noise in a voltage biased superconducting transition edge thermometer. Appl. Phys. Lett., 77(26), 4421–4424.
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Floet D. W., Gao J. R., Klapwijk T. M., & de Korte P. A. J. (2000). Bias Dependence of the Thermal Time Constant in Nb Superconducting Diffusion-Cooled HEB Mixers. Appl. Phys. Lett., 77, 1719.
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Tong, C. - Y. E., Kawamura, J., Todd, R. H., Papa, D. C., Blundell, R., Smith, M., et al. (2000). Successful operation of a 1 THz NbN hot-electron bolometer receiver. In Proc. 11th Int. Symp. Space Terahertz Technol. (pp. 49–59).
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Semenov, A. D., Hübers, H. –W., Schubert, J., Gol'tsman, G. N., Elantiev, A. I., Voronov, B. M., et al. (2000). Frequency dependent noise temperature of the lattice cooled hot-electron terahertz mixer. In Proc. 11th Int. Symp. Space Terahertz Technol. (pp. 39–48).
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