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Li, M., Pernice, W. H. P., Xiong, C., Baehr-Jones, T., Hochberg, M., & Tang, H. X. (2008). Harnessing optical forces in integrated photonic circuits. Nature, 456(7221), 480–484.
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Lydersen, L., Wiechers, C., Wittmann, C., Elser, D., Skaar, J., & Makarov, V. (2010). Hacking commercial quantum cryptography systems by tailored bright illumination. Nat. Photon., 4(10), 686–689.
Abstract: The peculiar properties of quantum mechanics allow two remote parties to communicate a private, secret key, which is protected from eavesdropping by the laws of physics. So-called quantum key distribution (QKD) implementations always rely on detectors to measure the relevant quantum property of single photons. Here we demonstrate experimentally that the detectors in two commercially available QKD systems can be fully remote-controlled using specially tailored bright illumination. This makes it possible to tracelessly acquire the full secret key; we propose an eavesdropping apparatus built of off-the-shelf components. The loophole is likely to be present in most QKD systems using avalanche photodiodes to detect single photons. We believe that our findings are crucial for strengthening the security of practical QKD, by identifying and patching technological deficiencies.
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Hadfield, R. H. (2009). Single-photon detectors for optical quantum information applications. Nature Photonics, 3, 696–705.
Abstract: The past decade has seen a dramatic increase in interest in new single-photon detector technologies. A major cause of this trend has undoubtedly been the push towards optical quantum information applications such as quantum key distribution. These new applications place extreme demands on detector performance that go beyond the capabilities of established single-photon detectors. There has been considerable effort to improve conventional photon-counting detectors and to transform new device concepts into workable technologies for optical quantum information applications. This Review aims to highlight the significant recent progress made in improving single-photon detector technologies, and the impact that these developments will have on quantum optics and quantum information science.
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Bonifas, A. P., & McCreery, R. L. (2010). ‘Soft’ Au, Pt and Cu contacts for molecular junctions through surface-diffusion-mediated deposition. Nat. Nanotech., 5(8), 612–617.
Abstract: Virtually all types of molecular electronic devices depend on electronically addressing a molecule or molecular layer through the formation of a metallic contact. The introduction of molecular devices into integrated circuits will probably depend on the formation of contacts using a vapour deposition technique, but this approach frequently results in the metal atoms penetrating or damaging the molecular layer. Here, we report a method of forming 'soft' metallic contacts on molecular layers through surface-diffusion-mediated deposition, in which the metal atoms are deposited remotely and then diffuse onto the molecular layer, thus eliminating the problems of penetration and damage. Molecular junctions fabricated by this method exhibit excellent yield (typically >90%) and reproducibility, and allow examination of the effects of molecular-layer structure, thickness and contact work function.
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Freer, E. M., Grachev, O., Duan, X., Martin, S., & Stumbo, D. P. (2010). High-yield self-limiting single-nanowire assembly with dielectrophoresis. Nat. Nanotech., 5(7), 525–530.
Abstract: Single-crystal nanowire transistors and other nanowire-based devices could have applications in large-area and flexible electronics if conventional top-down fabrication techniques can be integrated with high-precision bottom-up nanowire assembly. Here, we extend dielectrophoretic nanowire assembly to achieve a 98.5% yield of single nanowires assembled over 16,000 patterned electrode sites with submicrometre alignment precision. The balancing of surface, hydrodynamic and dielectrophoretic forces makes the self-assembly process controllable, and a hydrodynamic force component makes it self-limiting. Our approach represents a methodology to quantify nanowire assembly, and makes single nanowire assembly possible over an area limited only by the ability to reproduce process conditions uniformly.
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