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Author Boogaard, G.R.; Verbruggen, A.H.; Belzig, W.; Klapwijk T.M.
Title Resistance of superconducting nanowires connected to normal-metal leads Type Journal Article
Year 2004 Publication Phys. Rev. B Abbreviated Journal Phys. Rev. B
Volume 69 Issue Pages 220503(R)(1-4)
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Abstract We study experimentally the low temperature resistance of superconducting nanowires connected to normal metal reservoirs. Wefind that a substantial fraction of the nanowires is resistive, down to the lowest tempera-ture measured, indicative of an intrinsic boundary resistance due to the Andreev-conversion of normal current to supercurrent. The results are successfully analyzed in terms of the kinetic equations for diffusive superconductors.
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Call Number (down) RPLAB @ atomics90 @ Serial 960
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Author Kozorezov, A. G.; Lambert, C.; Marsili, F.; Stevens, M. J.; Verma, V. B.; Stern, J. A.; Horansky, R.; Dyer, S.; Duff, S.; Pappas, D. P.; Lita, A.; Shaw, M. D.; Mirin, R. P.; Sae Woo Nam
Title Quasiparticle recombination in hotspots in superconducting current-carrying nanowires Type Journal Article
Year 2015 Publication Abbreviated Journal Phys. Rev. B
Volume 92 Issue 6 Pages
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Abstract We describe a kinetic model of recombination of non-equilibrium quasiparticles generated by single photon absorption in superconducting current-carrying nanowires. The model is developed to interpret two-photon detection experiments in which a single photon does not possess sufficient energy for breaking superconductivity at a fixed low bias current. We show that quasiparticle self- recombination in relaxing hotspot dominates diffusion expansion effects and explains the observed strong bias current, wavelength and temperature dependencies of hotspot relaxation in tungsten silicide superconducting nanowire single-photon detectors.
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Call Number (down) RPLAB @ alex_kazakov @ Serial 1003
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Author Sergeev, A.; Mitin, V.
Title Electron-phonon interaction in disordered conductors: Static and vibrating scattering potentials Type Journal Article
Year 2000 Publication Phys. Rev. B. Abbreviated Journal Phys. Rev. B.
Volume 61 Issue 9 Pages 6041-6047
Keywords disordered conductors, scattering potential, electron-phonon interaction
Abstract Employing the Keldysh diagram technique, we calculate the electron-phonon energy relaxation rate in a conductor with the vibrating and static δ-correlated random electron-scattering potentials. If the scattering potential is completely dragged by phonons, this model yields the Schmid’s result for the inelastic electron-scattering rate τ−1e−ph. At low temperatures the effective interaction decreases due to disorder, and τ−1e−ph∝T4l (l is the electron mean-free path). In the presense of the static potential, quantum interference of numerous scattering processes drastically changes the effective electron-phonon interaction. In particular, at low temperatures the interaction increases, and τ−1e−ph∝T2/l. Along with an enhancement of the interaction, which is observed in disordered metallic films and semiconducting structures at low temperatures, the suggested model allows us to explain the strong sensitivity of the electron relaxation rate to the microscopic quality of a particular film.
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ISSN 0163-1829 ISBN Medium
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Call Number (down) Serial 307
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Author Smolyaninov, I. I.; Zayats, A. V.; Stanishevsky, A.; Davis, C. C.
Title Optical control of photon tunneling through an array of nanometer-scale cylindrical channels Type Journal Article
Year 2002 Publication Phys. Rev. B Abbreviated Journal Phys. Rev. B
Volume 66 Issue 20 Pages 205414_1-205414_5
Keywords optical mixing
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ISSN 1098-0121 ISBN Medium
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Call Number (down) Serial 499
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Author Su, M. Y.; Carter, S. G.; Sherwin, M. S.
Title Strong-field terahertz optical mixing in excitons Type Journal Article
Year 2003 Publication Phys. Rev. B Abbreviated Journal Phys. Rev. B
Volume 67 Issue 12 Pages
Keywords optical mixing
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Language Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1098-0121 ISBN Medium
Area Expedition Conference
Notes Approved no
Call Number (down) Serial 500
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