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Мошкова, М. А.; Дивочий, А. В.; Морозов, П. В.; Золотов, Ф. И.; Вахтомин, Ю. Б.; Смирнов, К. В. |
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Title |
Высокоэффективные NBN однофотонные детекторы с разрешением числа фотонов |
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Conference Article |
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Year |
2018 |
Publication |
Сборн. науч. труд. VII международн. конф. по фотонике и информац. опт. |
Abbreviated Journal |
Сборн. науч. труд. VII международн. конф. по фотонике и информац. опт. |
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400-401 |
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SSPD, SNSPD |
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Разработаны и исследованы сверхпроводниковые однофотонные детекторы, способные к разрешению до 3-х фотонов в коротком импульсе излучения и имеющие квантовую эффективность детектирования одиночных фотонов ~60% на длине волны lambda=1.55 мкм. Проведенная модернизация технологии изготовления детекторов, позволила получить приемные устройства с мультифотонной квантовой эффективностью, приближающейся к расчетным значениям. |
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Russian |
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978-5-7262-2445-9 |
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УДК 535(06)+004(06) |
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1250 |
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Манова, Н.Н.; Корнеева, Ю. П.; Корнеев, А. А., Гольцман, Г. Н. |
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Cверхпроводящий однофотонный детектор, интегрированный с оптическим резонатором |
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Conference Article |
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2010 |
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Науч. сессия НИЯУ МИФИ |
Abbreviated Journal |
Науч. сессия НИЯУ МИФИ |
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92-93 |
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SSPD |
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978-5-7262-1227-2 |
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УДК 533.14(06)+004.056(06) Фотоника и информационная оптика |
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1143 |
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Kitaygorsky, J.; Komissarov, I.; Jukna, A.; Pan, D.; Minaeva, O.; Kaurova, N.; Divochiy, A.; Korneev, A.; Tarkhov, M.; Voronov, B.; Milostnaya, I.; Gol'tsman, G.; Sobolewski, R.R. |
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Dark counts in nanostructured nbn superconducting single-photon detectors and bridges |
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Journal Article |
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2007 |
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IEEE Trans. Appl. Supercond. |
Abbreviated Journal |
IEEE Trans. Appl. Supercond. |
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17 |
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2 |
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275-278 |
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SSPD; SNSPD |
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We present our studies on dark counts, observed as transient voltage pulses, in current-biased NbN superconducting single-photon detectors (SSPDs), as well as in ultrathin (~4 nm), submicrometer-width (100 to 500 nm) NbN nanobridges. The duration of these spontaneous voltage pulses varied from 250 ps to 5 ns, depending on the device geometry, with the longest pulses observed in the large kinetic-inductance SSPD structures. Dark counts were measured while the devices were completely isolated (shielded by a metallic enclosure) from the outside world, in a temperature range between 1.5 and 6 K. Evidence shows that in our two-dimensional structures the dark counts are due to the depairing of vortex-antivortex pairs caused by the applied bias current. Our results shed some light on the vortex dynamics in 2D superconductors and, from the applied point of view, on intrinsic performance of nanostructured SSPDs. |
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1051-8223 |
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1248 |
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Korneev, A.; Korneeva, Y.; Florya, I.; Voronov, B.; Goltsman, G. |
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NbN nanowire superconducting single-photon detector for mid-infrared |
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Journal Article |
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2012 |
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Phys. Procedia |
Abbreviated Journal |
Phys. Procedia |
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36 |
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72-76 |
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Keywords |
NbN SSPD, SNSPD |
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Superconducting single-photon detectors (SSPD) is typically 100 nm-wide supercondiucting strip in a shape of meander made of 4-nm-thick film. To reduce response time and increase voltage response a parallel connection of the strips was proposed. Recently we demonstrated that reduction of the strip width improves the quantum effciency of such a detector at wavelengths longer than 1.5 μm. Being encourage by this progress in quantum effciency we improved the fabrication process and made parallel-wire SSPD with 40-nm-wide strips covering total area of 10 μm x 10 μm. In this paper we present the results of the characterization of such a parallel-wire SSPD at 10.6 μm wavelength and demonstrate linear dependence of the count rate on the light power as it should be in case of single-photon response. |
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1875-3892 |
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1382 |
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Milostnaya, I.; Korneev, A.; Tarkhov, M.; Divochiy, A.; Minaeva, O.; Seleznev, V.; Kaurova, N.; Voronov, B.; Okunev, O.; Chulkova, G.; Smirnov, K.; Gol’tsman, G. |
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Superconducting single photon nanowire detectors development for IR and THz applications |
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Journal Article |
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2008 |
Publication |
J. Low Temp. Phys. |
Abbreviated Journal |
J. Low Temp. Phys. |
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Volume |
151 |
Issue |
1-2 |
Pages |
591-596 |
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Keywords |
NbN SSPD, SNSPD |
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We present our progress in the development of superconducting single-photon detectors (SSPDs) based on meander-shaped nanowires made from few-nm-thick superconducting films. The SSPDs are operated at a temperature of 2–4.2 K (well below T c ) being biased with a current very close to the nanowire critical current at the operation temperature. To date, the material of choice for SSPDs is niobium nitride (NbN). Developed NbN SSPDs are capable of single photon counting in the range from VIS to mid-IR (up to 6 μm) with a record low dark counts rate and record-high counting rate. The use of a material with a low transition temperature should shift the detectors sensitivity towards longer wavelengths. We present state-of-the art NbN SSPDs as well as the results of our recent approach to expand the developed SSPD technology by the use of superconducting materials with lower T c , such as molybdenum rhenium (MoRe). MoRe SSPDs first were made and tested; a single photon response was obtained. |
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0022-2291 |
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1244 |
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Minaeva, O.; Fraine, A.; Korneev, A.; Divochiy, A.; Goltsman, G.; Sergienko, A. |
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Title |
High resolution optical time-domain reflectometry using superconducting single-photon detectors |
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Conference Article |
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2012 |
Publication |
Frontiers in Opt. 2012/Laser Sci. XXVIII |
Abbreviated Journal |
Frontiers in Opt. 2012/Laser Sci. XXVIII |
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Fw3a.39 |
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SSPD, SNSPD, Photodetectors; Fiber characterization; Light beams; Optical time domain reflectometry; Photon counting; Single mode fibers; Single photon detectors; Superconductors |
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We discuss the advantages and limitations of single-photon optical time-domain reflectometry with superconducting single-photon detectors. The higher two-point resolution can be achieved due to superior timing performance of SSPDs in comparison with InGaAs APDs. |
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Optical Society of America |
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1237 |
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Takemoto, K.; Nambu, Y.; Miyazawa, T.; Sakuma, Y.; Yamamoto, T.; Yorozu, S.; Arakawa, Y. |
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Quantum key distribution over 120 km using ultrahigh purity single-photon source and superconducting single-photon detectors |
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Journal Article |
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2015 |
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Sci. Rep. |
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5 |
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14383 |
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SSPD, SNSPD applications, quantum key distribution, QKD |
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Advances in single-photon sources (SPSs) and single-photon detectors (SPDs) promise unique applications in the field of quantum information technology. In this paper, we report long-distance quantum key distribution (QKD) by using state-of-the-art devices: a quantum-dot SPS (QD SPS) emitting a photon in the telecom band of 1.5 μm and a superconducting nanowire SPD (SNSPD). At the distance of 100 km, we obtained the maximal secure key rate of 27.6 bps without using decoy states, which is at least threefold larger than the rate obtained in the previously reported 50-km-long QKD experiment. We also succeeded in transmitting secure keys at the rate of 0.307 bps over 120 km. This is the longest QKD distance yet reported by using known true SPSs. The ultralow multiphoton emissions of our SPS and ultralow dark count of the SNSPD contributed to this result. The experimental results demonstrate the potential applicability of QD SPSs to practical telecom QKD networks. |
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1104 |
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McCarthy, Aongus; Krichel, Nils J.; Gemmell, Nathan R.; Ren, Ximing; Tanner, Michael G.; Dorenbos, Sander N.; Zwiller, Val; Hadfield, Robert H.; Buller, Gerald S. |
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Kilometer-range, high resolution depth imaging via 1560 nm wavelength single-photon detection |
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Journal Article |
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2013 |
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Opt. Express |
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Opt. Express |
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21 |
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7 |
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8904-8915 |
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SSPD, SNSPD, lidar, SSPD applications, SNSPD applications |
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This paper highlights a significant advance in time-of-flight depth imaging: by using a scanning transceiver which incorporated a free-running, low noise superconducting nanowire single-photon detector, we were able to obtain centimeter resolution depth images of low-signature objects in daylight at stand-off distances of the order of one kilometer at the relatively eye-safe wavelength of 1560 nm. The detector used had an efficiency of 18% at 1 kHz dark count rate, and the overall system jitter was ~100 ps. The depth images were acquired by illuminating the scene with an optical output power level of less than 250 µW average, and using per-pixel dwell times in the millisecond regime. |
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1053 |
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Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
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PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
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2000 |
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Microelectronics Reliability |
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Microelectronics Reliability |
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40 |
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1353-1358 |
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SSPD, CMOS testing |
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Normal operation of complementary metal-oxide semiconductor (CMOS) devices entails the emission of picosecond pulses of light, which can be used to diagnose circuit problems. The pulses that are observed from submicron sized field effect transistors (FETs) are synchronous with logic state switching. Picosecond Imaging Circuit Analysis (PICA), a new optical imaging technique combining imaging with timing, spatially resolves individual devices at the 0.5 micron level and switching events on a 10 picosecond timescale. PICA is used here for the diagnostics of failures on two VLSI microprocessors. |
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1054 |
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Stellari, Franco; Song, Peilin |
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Testing of ultra low voltage CMOS microprocessors using the superconducting single-photon detector (SSPD) |
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2005 |
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Proc. 12th IPFA |
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Proc. 12th IPFA |
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2 |
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SSPD, CMOS testing |
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In F. Stellari and P. Song (2004) the authors have shown a comparison among different detectors used for diagnosing integrated circuits (ICs) by means of the PICA method. In their experiments they used two versions of the SSPD detector (p-SSPD is a prototype version, while c-SSPD is the first commercially available generation of the detector as presented in W. K. Lo et al. (2002), as well as the imaging detector (S-25 photo-multiplier tube (PMT) as discussed in W. G. McMullan (1987)) used in the conventional PICA technique. A microprocessor chip fabricated in a 0.13 μm 1.2 V technology is used to show that c-SSPD provides a significant reduction in acquisition time for the collection of optical waveforms from chips running at very low. In this paper, the authors summarize the main results. |
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IEEE |
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0-7803-9301-5 |
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