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Author |
Title |
Year |
Publication |
DOI  |
Links |
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ГОСТ 2.711-82. ЕСКД. Схема деления изделия на составные части |
2000 |
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Khosropanah, P.; Merkel, H.; Yngvesson, S.; Adam, A.; Cherednichenko, S.; Kollberg, E. |
A distributed device model for phonon-cooled HEB mixers predicting IV characteristics, gain, noise and IF bandwidth |
2000 |
Proc. 11th Int. Symp. Space Terahertz Technol. |
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Leisawitz, David T.; Danchi, William C.; Dipirro, Michael J.; Feinberg, Lee D.; Gezari, Daniel Y.; Hagopian, Mike; Langer, William D.; Mather, John C.; Moseley, Jr. Samuel H.; Shao, Michael; Silverberg, Robert F.; Staguhn, Johannes G.; Swain, Mark R.; Yorke, Harold W.; Zhang, Xiaolei |
Scientific motivation and technology requirements for the SPIRIT and SPECS far-infrared/submillimeter space interferometers |
2000 |
Proc. SPIE |
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Hübers, Heinz-Wilhelm; Semenov, Alexei; Schubert, Josef; Gol'tsman, Gregory; Voronov, Boris; Gershenzon, Evgeni |
Performance of the phonon-cooled hot-electron bolometric mixer between 0.7 THz and 5.2 THz |
2000 |
Proc. 8-th Int. Conf. on Terahertz Electronics |
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Darula, Marian; Semenov, Alex D.; Hübers, Heinz-Wilhelm; Schubert, Josef |
Quasioptical high-Tc superconductor Josephson mixer at terahertz frequencies |
2000 |
Proc. 11th Int. Symp. Space Terahertz Technol. |
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Cherednichenko, S.; Rönnung, F.; Gol’tsman, G.; Kollberg, E.; Winkler, D. |
YBa2Cu3O7-δ hot-electron bolometer mixer at 0.6 THz |
2000 |
Proc. 11th Int. Symp. Space Terahertz Technol. |
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Cherednichenko, S.; Kroug, M.; Yagoubov, P.; Merkel, H.; Kollberg, E.; Yngvesson, K. S.; Voronov, B.; Gol’tsman, G. |
IF bandwidth of phonon cooled HEB mixers made from NbN films on MgO substrates |
2000 |
Proc. 11th Int. Symp. Space Terahertz Technol. |
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Смирнов, Константин Владимирович |
Энергетическая релаксация электронов в 2D-канале гетеропереходов GAAS/ALGAAS и транспортные процессы в структурах полупроводник-сверхпроводник на их основе |
2000 |
М. МПГУ |
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Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
10.1016/S0026-2714(00)00137-2 |
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Cherednichenko, S.; Rönnung, F.; Gol'tsman, G.; Kollberg, E.; Winkler, D. |
YBa2Cu3O7−δ hot-electron bolometer mixer |
2000 |
Phys. C: Supercond. |
10.1016/S0921-4534(00)01439-8 |
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