|
Author |
Title |
Year |
Publication |
DOI |
Links |
|
Semenov, A. D.; Hübers, H.-W.; Gol’tsman, G. N.; Smirnov, K. |
Superconducting quantum detector for astronomy and X-ray spectroscopy |
2002 |
Proc. Int. Workshop on Supercond. Nano-Electronics Devices |
10.1007/978-1-4615-0737-6_22 |
|
|
Fiore, A.; Marsili, F.; Bitauld, D.; Gaggero, A.; Leoni, R.; Mattioli, F.; Divochiy, A.; Korneev, A.; Seleznev, V.; Kaurova, N.; Minaeva, O.; Gol’tsman, G. |
Counting photons using a nanonetwork of superconducting wires |
2009 |
Nano-Net |
10.1007/978-3-642-02427-6_20 |
|
|
Milostnaya, I.; Korneev, A.; Tarkhov, M.; Divochiy, A.; Minaeva, O.; Seleznev, V.; Kaurova, N.; Voronov, B.; Okunev, O.; Chulkova, G.; Smirnov, K.; Gol’tsman, G. |
Superconducting single photon nanowire detectors development for IR and THz applications |
2008 |
J. Low Temp. Phys. |
10.1007/s10909-007-9691-4 |
|
|
de Lara, D. Perez; Ejrnaes, M.; Casaburi, A.; Lisitskiy, M.; Cristiano, R.; Pagano, S.; Gaggero, A.; Leoni, R.; Golt’sman, G.; Voronov, B. |
Feasibility investigation of NbN nanowires as detector in time-of-flight mass spectrometers for macromolecules of interest in biology (proteins) |
2008 |
J. Low Temp. Phys. |
10.1007/s10909-008-9745-2 |
|
|
Goltsman, G.; Korneev, A.; Izbenko, V.; Smirnov, K.; Kouminov, P.; Voronov, B.; Kaurova, N.; Verevkin, A.; Zhang, J.; Pearlman, A.; Slysz, W.; Sobolewski, R. |
Nano-structured superconducting single-photon detectors |
2004 |
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment |
10.1016/j.nima.2003.11.305 |
|
|
Korneev, A.; Korneeva, Y.; Florya, I.; Voronov, B.; Goltsman, G. |
NbN nanowire superconducting single-photon detector for mid-infrared |
2012 |
Phys. Procedia |
10.1016/j.phpro.2012.06.215 |
|
|
Seki, T.; Shibata, H.; Takesue, H.; Tokura, Y.; Imoto, N. |
Comparison of timing jitter between NbN superconducting single-photon detector and avalanche photodiode |
2010 |
Phys. C |
10.1016/j.physc.2010.05.156 |
|
|
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
10.1016/S0026-2714(00)00137-2 |
|
|
Korneev, A.; Lipatov, A.; Okunev, O.; Chulkova, G.; Smirnov, K.; Gol’tsman, G.; Zhang, J.; Slysz, W.; Verevkin, A.; Sobolewski, R. |
GHz counting rate NbN single-photon detector for IR diagnostics of VLSI CMOS circuits |
2003 |
Microelectronic Engineering |
10.1016/S0167-9317(03)00309-5 |
|
|
Lindgren, M.; Currie, M.; Zeng, W.-S.; Sobolewski, R.; Cherednichenko, S.; Voronov, B.; Gol'tsman, G. N. |
Picosecond response of a superconducting hot-electron NbN photodetector |
1998 |
Appl. Supercond. |
10.1016/S0964-1807(98)00110-0 |
|