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  Author Title Year Publication DOI (up) Links
Korneev, A.; Korneeva, Y.; Florya, I.; Voronov, B.; Goltsman, G. NbN nanowire superconducting single-photon detector for mid-infrared 2012 Phys. Procedia 10.1016/j.phpro.2012.06.215 details   doi
Seki, T.; Shibata, H.; Takesue, H.; Tokura, Y.; Imoto, N. Comparison of timing jitter between NbN superconducting single-photon detector and avalanche photodiode 2010 Phys. C 10.1016/j.physc.2010.05.156 details   doi
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis 2000 Microelectronics Reliability 10.1016/S0026-2714(00)00137-2 details   doi
Korneev, A.; Lipatov, A.; Okunev, O.; Chulkova, G.; Smirnov, K.; Gol’tsman, G.; Zhang, J.; Slysz, W.; Verevkin, A.; Sobolewski, R. GHz counting rate NbN single-photon detector for IR diagnostics of VLSI CMOS circuits 2003 Microelectronic Engineering 10.1016/S0167-9317(03)00309-5 details   doi
Lindgren, M.; Currie, M.; Zeng, W.-S.; Sobolewski, R.; Cherednichenko, S.; Voronov, B.; Gol'tsman, G. N. Picosecond response of a superconducting hot-electron NbN photodetector 1998 Appl. Supercond. 10.1016/S0964-1807(98)00110-0 details   doi
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