Cherednichenko, S., Rönnung, F., Gol’tsman, G., Kollberg, E., & Winkler, D. (2000). YBa2Cu3O7-δ hot-electron bolometer mixer at 0.6 THz. In Proc. 11th Int. Symp. Space Terahertz Technol. (pp. 517–522).
Abstract: We present an investigation of hot-electron bolometric mixer based on a YBa 2 Cu 3 O 7-δ (YBCO) superconducting thin film. Mixer conversion loss of –46 dB, absorbed local oscillator power and intermediate frequency bandwidth were measured at the local oscillator frequency 0.6 THz. The fabrication technique for nanoscale YBCO hot-electron bolometer (HEB) mixer integrated with a planar antenna structure is described.
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Cherednichenko, S., Kroug, M., Yagoubov, P., Merkel, H., Kollberg, E., Yngvesson, K. S., et al. (2000). IF bandwidth of phonon cooled HEB mixers made from NbN films on MgO substrates. In Proc. 11th Int. Symp. Space Terahertz Technol. (pp. 219–227).
Abstract: An investigation of gain and noise bandwidth of phonon-cooled hot-electron bolometric (HEB) mixers is presented. The radiation coupling to the mixers is quasioptical through either a spiral or twin-slot antenna. A maximum gain bandwidth of 4.8 GHz is obtained for mixers based on a 3.5 nm thin NbN film with Tc= 10 K. The noise bandwidth is 5.6 GHz, at the moment limited by parasitic elements in the, device mount fixture. At 0.65 THz the DSB receiver noise temperature is 700-800 К in the IF band 1-2 GHz, and 1150-2700 К in the band 3.5-7 GHz.
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Смирнов, К. В. (2000). Энергетическая релаксация электронов в 2D-канале гетеропереходов GAAS/ALGAAS и транспортные процессы в структурах полупроводник-сверхпроводник на их основе. Ph.D. thesis, , .
Abstract: Диссертация посвящена изучению электрон-фононного взаимодействия в двумерном электронном газе, образующемся на границе раздела полупроводников AlGaAs и GaAs, а также созданию на основе гетероперехода GaAs/AlGaAs и сверхпроводника NbN гибридных структур сверхпроводник-полупроводник-сверхпроводник и изучению их электрофизических свойств.
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Manus, M. K. M., Kash, J. A., Steen, S. E., Polonsky, S., Tsang, J. C., Knebel, D. R., et al. (2000). PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis. Microelectronics Reliability, 40, 1353–1358.
Abstract: Normal operation of complementary metal-oxide semiconductor (CMOS) devices entails the emission of picosecond pulses of light, which can be used to diagnose circuit problems. The pulses that are observed from submicron sized field effect transistors (FETs) are synchronous with logic state switching. Picosecond Imaging Circuit Analysis (PICA), a new optical imaging technique combining imaging with timing, spatially resolves individual devices at the 0.5 micron level and switching events on a 10 picosecond timescale. PICA is used here for the diagnostics of failures on two VLSI microprocessors.
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Cherednichenko, S., Rönnung, F., Gol'tsman, G., Kollberg, E., & Winkler, D. (2000). YBa2Cu3O7−δ hot-electron bolometer mixer. Phys. C: Supercond., 341-348, 2653–2654.
Abstract: We present an investigation of hot-electron bolometric mixer based on YBa2Cu3O7−δ (YBCO) superconducting thin film. Mixer conversion loss, absorbed local oscillator power and intermediate frequency bandwidth was measured at the local oscillator frequency 600 GHz. The fabrication technique for nanoscale YBCO hot-electron bolometer (HEB) mixer integrated into planar antenna structure is described.
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