Author |
Title |
Year |
Publication |
Volume |
Pages |
Milostnaya, I.; Korneev, A.; Tarkhov, M.; Divochiy, A.; Minaeva, O.; Seleznev, V.; Kaurova, N.; Voronov, B.; Okunev, O.; Chulkova, G.; Smirnov, K.; Gol’tsman, G. |
Superconducting single photon nanowire detectors development for IR and THz applications |
2008 |
J. Low Temp. Phys. |
151 |
591-596 |
Korneev, A.; Lipatov, A.; Okunev, O.; Chulkova, G.; Smirnov, K.; Gol’tsman, G.; Zhang, J.; Slysz, W.; Verevkin, A.; Sobolewski, R. |
GHz counting rate NbN single-photon detector for IR diagnostics of VLSI CMOS circuits |
2003 |
Microelectronic Engineering |
69 |
274-278 |
Varyukhin, S. V.; Zakharov, A. A.; Gershenzon, E. M.; Gol'tsman, G. N.; Ptitsyna, N. G.; Chulkova, G. M. |
AC losses and submillimeter absorption in single crystals La2CuO4 |
1990 |
Phys. B Condens. Mat. |
165-166 |
1269-1270 |
Sergeev, A.; Karasik, B. S.; Ptitsina, N. G.; Chulkova, G. M.; Il'in, K. S.; Gershenzon, E. M. |
Electron–phonon interaction in disordered conductors |
1999 |
Phys. Rev. B Condens. Matter |
263-264 |
190-192 |
Zhang, J.; Boiadjieva, N.; Chulkova, G.; Deslandes, H.; Gol'tsman, G. N.; Korneev, A.; Kouminov, P.; Leibowitz, M.; Lo, W.; Malinsky, R.; Okunev, O.; Pearlman, A.; Slysz, W.; Smirnov, K.; Tsao, C.; Verevkin, A.; Voronov, B.; Wilsher, K.; Sobolewski, R. |
Noninvasive CMOS circuit testing with NbN superconducting single-photon detectors |
2003 |
Electron. Lett. |
39 |
1086-1088 |