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Author Title Year Publication Volume Pages
Prober, D. E. Superconducting terahertz mixer using a transition-edge microbolometer 1993 Appl. Phys. Lett. 62 2119-2121
Miller, Aaron J.; Lita, Adriana E.; Calkins, Brice; Vayshenker, Igor; Gruber, Steven M.; Nam, Sae Woo Compact cryogenic self-aligning fiber-to-detector coupling with losses below one percent 2011 Optics Express 19 9102-9110
Hoevers, H. F. C.; Bento, A. C.; Bruijn, M. P.; Gottardi, L.; Korevaar, M. A. N.; Mels, W. A.; de Korte, P. A. J. Thermal fluctuation noise in a voltage biased superconducting transition edge thermometer 2000 Applied Physics Letters 77 4421-4424
Kooi, Jacob Willem Advanced receivers for submillimeter and far infrared astronomy 2008 University of Groningen
Galeazzi, Massimiliano Fundamental noise processes in TES devices 2011 IEEE Trans. Appl. Supercond. 21 267-271
Bennett, Douglas A.; Schmidt, Daniel R.; Swetz, Daniel S.; Ullom, Joel N. Phase-slip lines as a resistance mechanism in transition-edge sensors 2014 Appl. Phys. Lett. 104 042602
Titova, N; Kardakova, A.; Tovpeko, N; Ryabchun, S.; Mandal, S.; Morozov, D.; Klemencic, G. M.; Giblin, S.R.; Williams, O. A.; Goltsman, G. N. Superconducting diamond films as perspective material for direct THz detectors 2017 Proc. 28th Int. Symp. Space Terahertz Technol. 82
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis 2000 Microelectronics Reliability 40 1353-1358
Stellari, Franco; Song, Peilin Testing of ultra low voltage CMOS microprocessors using the superconducting single-photon detector (SSPD) 2005 Proc. 12th IPFA 2
Steudle, Gesine A.; Schietinger, Stefan; Höckel, David; Dorenbos, Sander N.; Zadeh, Iman E.; Zwiller, Valery; Benson, Oliver Measuring the quantum nature of light with a single source and a single detector 2012 Phys. Rev. A 86 053814