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Author | Title | Year | Publication | Volume | Pages |
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Zhang, J.; Boiadjieva, N.; Chulkova, G.; Deslandes, H.; Gol'tsman, G. N.; Korneev, A.; Kouminov, P.; Leibowitz, M.; Lo, W.; Malinsky, R.; Okunev, O.; Pearlman, A.; Slysz, W.; Smirnov, K.; Tsao, C.; Verevkin, A.; Voronov, B.; Wilsher, K.; Sobolewski, R. | Noninvasive CMOS circuit testing with NbN superconducting single-photon detectors | 2003 | Electron. Lett. | 39 | 1086-1088 |