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Author | Title | Year | Publication | Volume | Pages |
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Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. | PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis | 2000 | Microelectronics Reliability | 40 | 1353-1358 |
Stellari, Franco; Song, Peilin | Testing of ultra low voltage CMOS microprocessors using the superconducting single-photon detector (SSPD) | 2005 | Proc. 12th IPFA | 2 |