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Semenov, A. D., Hübers, H. - W., Schubert, J., Gol'tsman, G. N., Elantiev, A. I., Voronov, B. M., et al. (2000). Design and performance of the lattice-cooled hot-electron terahertz mixer. J. Appl. Phys., 88(11), 6758–6767.
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Sergeev, A., & Mitin, V. (2000). Electron-phonon interaction in disordered conductors: Static and vibrating scattering potentials. Phys. Rev. B., 61(9), 6041–6047.
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Hoevers, H. F. C., Bento, A. C., Bruijn, M. P., Gottardi, L., Korevaar, M. A. N., Mels, W. A., et al. (2000). Thermal fluctuation noise in a voltage biased superconducting transition edge thermometer. Appl. Phys. Lett., 77(26), 4421–4424.
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Il'in, K. S., Lindgren, M., Currie, M. A., Semenov, D., Gol'tsman, G. N., Sobolewski, R., et al. (2000). Picosecond hot-electron energy relaxation in NbN superconducting photodetectors. Appl. Phys. Lett., 76(19), 2752–2754.
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Cherednichenko, S., Rönnung, F., Gol'tsman, G., Kollberg, E., & Winkler, D. (2000). YBa2Cu3O7−δ hot-electron bolometer mixer. Phys. C: Supercond., 341-348, 2653–2654.
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Floet D. W., Gao J. R., Klapwijk T. M., & de Korte P. A. J. (2000). Bias Dependence of the Thermal Time Constant in Nb Superconducting Diffusion-Cooled HEB Mixers. Appl. Phys. Lett., 77, 1719.
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Manus, M. K. M., Kash, J. A., Steen, S. E., Polonsky, S., Tsang, J. C., Knebel, D. R., et al. (2000). PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis. Microelectronics Reliability, 40, 1353–1358.
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Gerecht, E., Musante, C. F., Zhuang, Y., Ji, M., Yngvesson, K. S., Goyette, T., et al. (2000). NbN hot electron bolometric mixer with intrinsic receiver noise temperature of less than five times the quantum noise limit. In Proc. IMS (Vol. 2, pp. 1007–1010).
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Kawamura, J., Blundell, R., Tong, C. - Y. E., Papa, D. C., Hunter, T. R., Paine, St. N., et al. (2000). Superconductive hot-electron bolometer mixer receiver for 800 GHz operation (Vol. 48).
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Kawamura, J., Blundell, R., Tong, C. - Y. E., Papa, D. C., Hunter, T. R., Paine, S. N., et al. (2000). Superconductive hot-electron-bolometer mixer receiver for 800-GHz operation. IEEE Trans. Microw. Theory Techn., 48(4), 683–689.
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