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Nebosis, R. S.; Heusinger, M. A.; Semenov, A. D.; Lang, P. T.; Schatz, W.; Steinke, R.; Renk, K. F.; Gol'tsman, G. N.; Karasik, B. S.; Gershenzon, E. M. Ultrafast photoresponse of an YBa2Cu3O7-δ film to far-infrared radiation pulses 1993 Opt. Lett. 18 96-97 details   doi
Gol’tsman, G. N.; Gershenzon, E. M. High speed hot-electron superconducting bolometer 1993 Proc. SPIE 2104 181-182 details   doi
Danerud, M.; Winkler, D.; Zorin, M.; Trifonov, V.; Karasik, B.; Gershenzon, E. M.; Gol'tsman, G. N.; Lindgren, M. Picosecond detection of infrared radiation with YBa2Cu3O7-δ thin films 1993 Proc. SPIE 2104 183-184 details   doi
Gol’tsman, G. N.; Semenov, A. D.; Sergeev, A. V.; Aksaev, E. E.; Gogidze, I. G.; Gershenzon, E. M. Electron-phonon interaction in thin YBaCuO films and fast detectors 1993 Phonon Scattering in Condensed Matter VII. Springer Series in Solid-State Sciences 112 184-185 details   doi
Heusinger, M. A.; Nebosis,R. S.; Schatz, W.; Renk, K. F.; Gol’tsman, G. N.; Karasik, B. S.; Semenov, A. D.; Gershenzon, E. M. Temperature dependence of bolometric and non-bolometric photoresponse of a structured YBa2Cu3O7-δ thin film 1993 Phonon Scattering in Condensed Matter VII. Springer Series in Solid-State Sciences 112 193-195 details   doi
Sergeev, A. V.; Livanov, D. V. Phonon renormalization of thermoelectric power of high-Tc materials 1993 Phonon Scattering in Condensed Matter VII. Springer Series in Solid-State Sciences 112 204-205 details   doi
Gershenzon, E. M.; Gol'tsman, G. N. Hot-electron superconducting mixers 1993 Proc. SPIE 2104 329-330 details   doi
Maas, S. SIS mixers 1993 Artech House 338-340 details   openurl
Tonguz, O.K.; Hwang, B. Noise performance of AFC loops in optical heterodyne receivers 1993 Proc. Lasers and Electro-Optics Society Annual Meeting 361-362 details   openurl
Sergeev, A. V.; Aksaev, E. E.; Gogidze, I. G.; Gol’tsman, G. N.; Semenov, A. D.; Gershenzon, E. M. Thermal boundary resistance at YBaCuO film-substrate interface 1993 Phonon Scattering in Condensed Matter VII. Springer Series in Solid-State Sciences 112 405-406 details   doi
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