| Author |
Title |
Year |
Publication |
Volume |
Pages  |
| Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
40 |
1353-1358 |
| Prober, D. E. |
Superconducting terahertz mixer using a transition-edge microbolometer |
1993 |
Appl. Phys. Lett. |
62 |
2119-2121 |
| Gorokhov, G.; Bychanok, D.; Gayduchenko, I.; Rogov, Y.; Zhukova, E.; Zhukov, S.; Kadyrov, L.; Fedorov, G.; Ivanov, E.; Kotsilkova, R.; Macutkevic, J.; Kuzhir, P. |
THz spectroscopy as a versatile tool for filler distribution diagnostics in polymer nanocomposites |
2020 |
Polymers (Basel) |
12 |
3037 (1 to 14) |
| Hoevers, H. F. C.; Bento, A. C.; Bruijn, M. P.; Gottardi, L.; Korevaar, M. A. N.; Mels, W. A.; de Korte, P. A. J. |
Thermal fluctuation noise in a voltage biased superconducting transition edge thermometer |
2000 |
Applied Physics Letters |
77 |
4421-4424 |
| Miller, Aaron J.; Lita, Adriana E.; Calkins, Brice; Vayshenker, Igor; Gruber, Steven M.; Nam, Sae Woo |
Compact cryogenic self-aligning fiber-to-detector coupling with losses below one percent |
2011 |
Optics Express |
19 |
9102-9110 |
