|
Author |
Title |
Year |
Publication |
Volume |
Pages |
Links |
|
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
40 |
1353-1358 |
|
|
Verevkin, A.; Pearlman, A.; Slysz, W.; Zhang, J.; Currie, M.; Korneev, A.; Chulkova, G.; Okunev, O.; Kouminov, P.; Smirnov, K.; Voronov, B.; Gol'tsman, G. N.; Sobolewski, R. |
Ultrafast superconducting single-photon detectors for near-infrared-wavelength quantum communications |
2004 |
J. Modern Opt. |
51 |
1447-1458 |
|
|
Gol'tsman, G. N.; Korneev, A.; Rubtsova, I.; Milostnaya, I.; Chulkova, G.; Minaeva, O.; Smirnov, K.; Voronov, B.; Słysz, W.; Pearlman, A.; Verevkin, A.; Sobolewski, R. |
Ultrafast superconducting single-photon detectors for near-infrared-wavelength quantum communications |
2005 |
Phys. Stat. Sol. (C) |
2 |
1480-1488 |
|
|
Seki, T.; Shibata, H.; Takesue, H.; Tokura, Y.; Imoto, N. |
Comparison of timing jitter between NbN superconducting single-photon detector and avalanche photodiode |
2010 |
Phys. C |
470 |
1534-1537 |
|
|
Goltsman, G.; Korneev, A.; Divochiy, A.; Minaeva, O.; Tarkhov, M.; Kaurova, N.; Seleznev, V.; Voronov, B.; Okunev, O.; Antipov, A.; Smirnov, K.; Vachtomin, Yu.; Milostnaya, I.; Chulkova, G. |
Ultrafast superconducting single-photon detector |
2009 |
J. Modern Opt. |
56 |
1670-1680 |
|