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Loudkov, D., Tong, C. - Y. E., Marrone, D. P., Ryabchun, S., Paine, S. N., & Blundell, R. (2005). Transmission measurements of infrared filters for low-noise terahertz receiver applications. In Proc. 16th Int. Symp. Space Terahertz Technol. (pp. 354–357).
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Meledin, D. V., Marrone, D. P., Tong, C. - Y. E., Gibson, H., Blundell, R., Paine, S. N., et al. (2004). A 1-THz superconducting hot-electron-bolometer receiver for astronomical observations. IEEE Trans. Microwave Theory Techn., 52(10), 2338–2343.
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Meledin, D., Tong, C. - Y. E., Blundell, R., & Goltsman, G. (2003). Measurement of intermediate frequency bandwidth of hot electron bolometer mixers at terahertz frequency range. IEEE Microw. Wireless Compon. Lett., 13(11), 493–495.
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Kawamura, J., Tong, C. - Y. E., Blundell, R., Papa, D. C., Hunter, T. R., Patt, F., et al. (2001). Terahertz-frequency waveguide NbN hot-electron bolometer mixer. IEEE Trans. Appl. Supercond., 11(1), 952–954.
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Tong, C. E., Blundell, R., Papa, D. C., Smith, M., Kawamura, J., Gol'tsman, G., et al. (1999). An all solid-state superconducting heterodyne receiver at terahertz frequencies. IEEE Microw. Guid. Wave Lett., 9(9), 366–368.
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Kawamura, J., Blundell, R., Tong, C. -yu E., Gol’tsman, G., Gershenzon, E., Voronov, B., et al. (1997). Low noise NbN lattice-cooled superconducting hot-electron bolometric mixers at submillimeter wavelengths. Appl. Phys. Lett., 70(12), 1619–1621.
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Kawamura, J., Blundell, R., Tong, C. ‐yu E., Gol’tsman, G., Gershenzon, E., & Voronov, B. (1996). Performance of NbN lattice‐cooled hot‐electron bolometric mixers. J. Appl. Phys., 80(7), 4232–4234.
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Kawamura, J., Blundell, R., Tong, C. - Y. E., Gol'tsman, G., Gershenzon, E., & Voronov, B. (1995). NbN hot-electron mixer measurements at 200 GHz. In Proc. 6th Int. Symp. Space Terahertz Technol. (pp. 254–261).
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Blundell, R., Kawamura, J. H., Tong, C. E., Papa, D. C., Hunter, T. R., Gol’tsman, G. N., et al. (1998). A hot-electron bolometer mixer receiver for the 680-830 GHz frequency range. In Proc. 6-th Int. Conf. Terahertz Electron. (pp. 18–20). IEEE.
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