| Author |
Title |
Year |
Publication |
Volume |
Pages |
| Hoevers, H. F. C.; Bento, A. C.; Bruijn, M. P.; Gottardi, L.; Korevaar, M. A. N.; Mels, W. A.; de Korte, P. A. J. |
Thermal fluctuation noise in a voltage biased superconducting transition edge thermometer |
2000 |
Applied Physics Letters |
77 |
4421-4424 |
| Burke, P. J.; Schoelkopf, R. J.; Prober, D. E.; Skalare, A.; Karasik, B. S.; Gaidis, M. C.; McGrath, W. R.; Bumble, B.; Leduc, H. G. |
Spectrum of thermal fluctuation noise in diffusion and phonon cooled hot-electron mixers |
1998 |
Applied Physics Letters |
72 |
1516-1518 |
| Khosropanah, Pourya |
NbN and NbTiN hot electron bolometer THz mixers |
2003 |
Chalmers University of Technology |
|
|
| Yagoubov, P.; Kroug, M.; Merkel, H.; Kollberg, E.; Gol'tsman, G.; Svechnikov, S.; Gershenzon, E. |
Noise temperature and local oscillator power requirement of NbN phonon-cooled hot electron bolometric mixers at terahertz frequencies |
1998 |
Appl. Phys. Lett. |
73 |
2814-2816 |
| Galeazzi, Massimiliano |
Fundamental noise processes in TES devices |
2011 |
IEEE Trans. Appl. Supercond. |
21 |
267-271 |
