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Sergeev, A. V., Semenov, A. D., Kouminov, P., Trifonov, V., Goghidze, I. G., Karasik, B. S., et al. (1994). Transparency of a YBa2Cu3O7-film/substrate interface for thermal phonons measured by means of voltage response to radiation. Phys. Rev. B Condens. Matter., 49(13), 9091–9096.
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Tikhonov, V. V., Polyakova, O. N., Gol’tsman, G. N., Dzardanov, A. L., & Boyarskiy, D. A. (2008). Determination of dielectric properties of ore minerals in the microwave band. Radiophys. Quant. Electron., 51(12), 966–974.
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Semenov, A. D., & Gol’tsman, G. N. (2000). Nonthermal mixing mechanism in a diffusion-cooled hot-electron detector. J. Appl. Phys., 87(1), 502–510.
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Karasik, B. S., Zorin, M. A., Milostnaya, I. I., Elantev, A. I., Gol’tsman, G. N., & Gershenzon, E. M. (1995). Subnanosecond switching of YBaCuO films between superconducting and normal states induced by current pulse. J. Appl. Phys., 77(8), 4064–4070.
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Danerud, M., Winkler, D., Lindgren, M., Zorin, M., Trifonov, V., Karasik, B. S., et al. (1994). Nonequilibrium and bolometric photoresponse in patterned YBa2Cu3O7−δ thin films. J. Appl. Phys., 76(3), 1902–1909.
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Nebosis, R. S., Steinke, R., Lang, P. T., Schatz, W., Heusinger, M. A., Renk, K. F., et al. (1992). Picosecond YBa2Cu3O7−δdetector for far‐infrared radiation. J. Appl. Phys., 72(11), 5496–5499.
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Tuchak, A. N., Gol’tsman, G. N., Kitaeva, G. K., Penin, A. N., Seliverstov, S. V., Finkel, M. I., et al. (2012). Generation of nanosecond terahertz pulses by the optical rectification method. JETP Lett., 96(2), 94–97.
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Gol’tsman, G. N., & Smirnov, K. V. (2001). Electron-phonon interaction in a two-dimensional electron gas of semiconductor heterostructures at low temperatures. Jetp Lett., 74(9), 474–479.
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Smirnov, K. V., Ptitsina, N. G., Vakhtomin, Y. B., Verevkin, A. A., Gol’tsman, G. N., & Gershenzon, E. M. (2000). Energy relaxation of two-dimensional electrons in the quantum Hall effect regime. JETP Lett., 71(1), 31–34.
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Verevkin, A. A., Ptitsina, N. G., Smirnov, K. V., Gol’tsman, G. N., Gershenzon, E. M., & Ingvesson, K. S. (1996). Direct measurements of energy relaxation times on an AlGaAs/GaAs heterointerface in the range 4.2–50 K. JETP Lett., 64(5), 404–409.
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