| |
Author |
Title |
Year |
Publication |
Volume |
Pages |
Links |
|
|
Varyukhin, S. V.; Zakharov, A. A.; Gershenzon, E. M.; Gol'tsman, G. N.; Ptitsina, N. G.; Chulkova, G. M. |
Low energy excitation in La2CuO4 |
1990 |
Sverkhprovodimost': Fizika, Khimiya, Tekhnika |
3 |
832-837 |
|
|
|
Aksaev, E. E.; Gershenzon, E. M.; Gol'tsman, G. N.; Semenov, A. D.; Sergeev, A. V. |
Interaction of electrons with thermal phonons in YBa2Cu3O7-δ films at low temperatures |
1989 |
JETP Lett. |
50 |
283-286 |
|
|
|
Gershenzon, E. M.; Gol'tsman, G. N.; Elant'ev, A. I.; Karasik, B. S.; Potoskuev, S. E. |
Intense electromagnetic radiation heating of superconductor electrons in resistive state |
1988 |
Fizika Nizkikh Temperatur |
14 |
753-763 |
|
|
|
Gershenzon, E. M.; Gol'tsman, G. N.; Mirskii, G. I. |
Submillimeter backward-wave-tube spectrometer-relaxometer |
1987 |
Pribory i Tekhnika Eksperimenta |
30 |
131-137 |
|
|
|
Gershenzon, E. M.; Gol'tsman, G. N.; Karasik, B. S.; Semenov, A. D. |
Measurement of the energy gap in the compound YBaCu3O9-δ on the basis of the IR absorption spectrum |
1987 |
JETP Lett. |
46 |
237-238 |
|
|
|
Gol'tsman, G. N.; Gusinskii, E. N.; Malyavkin, A. V.; Ptitsina, N. G.; Selevko, A. G.; Edel'shtein, V. M. |
The excitonic Zeeman effect in uniaxially-strained germanium |
1987 |
Sov. Phys. JETP |
65 |
1233-1241 |
|
|
|
Gershenzon, E. M.; Gershenzon, M. E.; Gol'tsman, G. N.; Karasik, B. S.; Semenov, A. D.; Sergeev, A. V. |
Light-induced heating of electrons and the time of the inelastic electron-phonon scattering in the YBaCuO compound |
1987 |
JETP Lett. |
46 |
285-287 |
|
|
|
Gershenzon, E. M.; Gol'tsman, G. N.; Ptitsina, N. G.; Riger, E. R. |
Effect of electron-electron collisions on the trapping of free carriers by shallow impurity centers in germanium |
1986 |
Sov. Phys. JETP |
64 |
889-897 |
|
|
|
Gershenzon, E. M.; Gol'tsman, G. N.; Ptitsina, N. G. |
Observation of the free-exciton spectrum at submillimeter wavelengths |
1972 |
JETP Lett. |
16 |
161-162 |
|
|
|
Gershenson, E. M.; Gol'tsman, G. N.; Elant'ev, A. I.; Kagane, M. L.; Multanovskii, V. V.; Ptitsina, N. G. |
Use of submillimeter backward-wave tube spectroscopy in determination of the chemical nature and concentration of residual impurities in pure semiconductors |
1983 |
Sov. Phys. Semicond. |
17 |
908-913 |
|
