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Elezov, M. S., Shcherbatenko, M. L., Sych, D. V., & Goltsman, G. N. (2020). Development of control method for an optimal quantum receiver. In J. Phys.: Conf. Ser. (Vol. 1695, 012126).
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Shcherbatenko, M., Elezov, M., Sych, D., & Goltsman, G. N. (2020). Optimal fiber optic scheme for sub-SQL quantum receiver realization. In J. Phys.: Conf. Ser. (Vol. 1695, 012140).
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Ovchinnikov, O. V., Perepelitsa, A. S., Smirnov, M. S., Latyshev, A. N., Grevtseva, I. G., Vasiliev, R. B., et al. (2020). Luminescence of colloidal Ag2S/ZnS core/shell quantum dots capped with thioglycolic acid. J. Luminescence, 220, 117008 (1 to 7).
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Matyushkin, Y., Fedorov, G., Moskotin, M., Danilov, S., Ganichev, S., & Goltsman, G. (2020). Gate-mediated helicity sensitive detectors of terahertz radiation with graphene-based field effect transistors. In Graphene and 2dm Virt. Conf..
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Dryazgov, M., Semenov, A., Manova, N., Korneeva, Y., & Korneev, A. (2020). Modelling of normal domain evolution after single-photon absorption of a superconducting strip of micron width. In J. Phys.: Conf. Ser. (Vol. 1695, 012195 (1 to 4)).
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Manova, N. N., Simonov, N. O., Korneeva, Y. P., & Korneev, A. A. (2020). Developing of NbN films for superconducting microstrip single-photon detector. In J. Phys.: Conf. Ser. (Vol. 1695, 012116 (1 to 5)).
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Polyakova, M. I., Korneev, A. A., & Semenov, A. V. (2020). Comparison single- and double- spot detection efficiencies of SSPD based to MoSi and NbN films. In J. Phys.: Conf. Ser. (Vol. 1695, 012146 (1 to 3)).
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Elmanov, I., Elmanova, A., Kovalyuk, V., An, P., & Goltsman, G. (2020). Integrated contra-directional coupler for NV-centers photon filtering. In Proc. 32-nd EMSS (pp. 354–360).
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Elmanov, I., Elmanova, A., Kovalyuk, V., An, P., & Goltsman, G. (2020). Silicon nitride photonic crystal cavity coupled with NV-centers in nanodiamonds. In Proc. 32-nd EMSS (pp. 344–348).
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Vasilev, D. D., Malevannaya, E. I., Moiseev, K. M., Zolotov, P. I., Antipov, A. V., Vakhtomin, Y. B., et al. (2020). Influence of deposited material energy on superconducting properties of the WSi films. In IOP Conf. Ser.: Mater. Sci. Eng. (Vol. 781, 012013 (1 to 6)).
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