Leisawitz, D. T., Danchi, W. C., Dipirro, M. J., Feinberg, L. D., Gezari, D. Y., Hagopian, M., et al. (2000). Scientific motivation and technology requirements for the SPIRIT and SPECS far-infrared/submillimeter space interferometers. In Proc. SPIE (Vol. 4013, pp. 36–46).
Abstract: Far infrared interferometers in space would enable extraordinary measurements of the early universe, the formation of galaxies, stars, and planets, and would have great discovery potential. Since half the luminosity of the universe and 98% of the photons released since the Big Bang are now observable at far IR wavelengths (40 – 500 micrometers ), and the Earth's atmosphere prevents sensitive observations from the ground, this is one of the last unexplored frontiers of space astronomy. We present the engineering and technology requirements that stem from a set of compelling scientific goals and discuss possible configurations for two proposed NASA missions, the Space Infrared Interferometric Telescope and the Submillimeter Probe of the Evolution of Cosmic Structure.
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Floet D. W., Gao J. R., Klapwijk T. M., & de Korte P. A. J. (2000). Bias Dependence of the Thermal Time Constant in Nb Superconducting Diffusion-Cooled HEB Mixers. Appl. Phys. Lett., 77, 1719.
Abstract: We present an experimental study of the intermediate frequency bandwidth of a Nb diffusion-cooled hot-electron bolometer mixer for different bias voltages. The measurements show that the bandwidth increases with increasing voltage. Analysis of the data reveals that this effect is mainly caused by a decrease of the intrinsic thermal time of the mixer and that the effect of electrothermal feedback through the intermediate frequency circuit is small. The results are understood using a qualitative model, which takes into account the different effective diffusion constants in the normal and superconducting domains.
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Manus, M. K. M., Kash, J. A., Steen, S. E., Polonsky, S., Tsang, J. C., Knebel, D. R., et al. (2000). PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis. Microelectronics Reliability, 40, 1353–1358.
Abstract: Normal operation of complementary metal-oxide semiconductor (CMOS) devices entails the emission of picosecond pulses of light, which can be used to diagnose circuit problems. The pulses that are observed from submicron sized field effect transistors (FETs) are synchronous with logic state switching. Picosecond Imaging Circuit Analysis (PICA), a new optical imaging technique combining imaging with timing, spatially resolves individual devices at the 0.5 micron level and switching events on a 10 picosecond timescale. PICA is used here for the diagnostics of failures on two VLSI microprocessors.
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Cherednichenko, S., Rönnung, F., Gol'tsman, G., Kollberg, E., & Winkler, D. (2000). YBa2Cu3O7−δ hot-electron bolometer mixer. Phys. C: Supercond., 341-348, 2653–2654.
Abstract: We present an investigation of hot-electron bolometric mixer based on YBa2Cu3O7−δ (YBCO) superconducting thin film. Mixer conversion loss, absorbed local oscillator power and intermediate frequency bandwidth was measured at the local oscillator frequency 600 GHz. The fabrication technique for nanoscale YBCO hot-electron bolometer (HEB) mixer integrated into planar antenna structure is described.
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Hübers, H. - W., Semenov, A., Schubert, J., Gol'tsman, G., Voronov, B., & Gershenzon, E. (2000). Performance of the phonon-cooled hot-electron bolometric mixer between 0.7 THz and 5.2 THz. In Proc. 8-th Int. Conf. on Terahertz Electronics (pp. 117–119).
Abstract: We report on the phonon cooled NbN hot electron bolometer as mixer in the terahertz frequency range. Its hybrid antenna consists of a hyperhemispheric silicon lens and a logarithmic-spiral feed antenna. Noise temperatures have been measured between 0.7 THz and 5.2 THz. A quarter wavelength layer of Parylene works as antireflection coating for the silicon lens and reduces the noise temperature by about 30. It was found that the antenna pattern at 2.5 THz is determined by the feed antenna and not by the diameter of the lens.
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