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Author Prober, D. E.
Title Superconducting terahertz mixer using a transition-edge microbolometer Type Journal Article
Year 1993 Publication Appl. Phys. Lett. Abbreviated Journal Appl. Phys. Lett.
Volume 62 Issue (up) 17 Pages 2119-2121
Keywords HEB mixer, NbN, TES
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Notes Recommended by Klapwijk Approved no
Call Number Serial 244
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Author Gershenzon, E. M.; Gol'tsman, G. N.
Title Transitions of electrons between excited states of donors in germanium Type Journal Article
Year 1971 Publication JETP Lett. Abbreviated Journal JETP Lett.
Volume 14 Issue (up) 2 Pages 63-65
Keywords Ge, donors, excited states
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Call Number Serial 1740
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Author Hoevers, H. F. C.; Bento, A. C.; Bruijn, M. P.; Gottardi, L.; Korevaar, M. A. N.; Mels, W. A.; de Korte, P. A. J.
Title Thermal fluctuation noise in a voltage biased superconducting transition edge thermometer Type Journal Article
Year 2000 Publication Applied Physics Letters Abbreviated Journal Appl. Phys. Lett.
Volume 77 Issue (up) 26 Pages 4421-4424
Keywords TES; bolometer; thermal fluctuation noise; TFN
Abstract The current noise at the output of a microcalorimeter with a voltage biased superconducting transition edge thermometer is studied in detail. In addition to the two well-known noise sources: thermal fluctuation noise from the heat link to the bath and Johnson noise from the resistive thermometer, a third noise source strongly correlated with the steepness of the thermometer is required to fit the measured noise spectra. Thermal fluctuation noise, originating in the thermometer itself, fully explains the additional noise. A simple model provides quantitative agreement between the observed and calculated noise spectra for all bias points in the superconducting transition.
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Call Number RPLAB @ gujma @ Serial 759
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Author Galeazzi, Massimiliano
Title Fundamental noise processes in TES devices Type Journal Article
Year 2011 Publication IEEE Trans. Appl. Supercond. Abbreviated Journal IEEE Trans. Appl. Supercond.
Volume 21 Issue (up) 3 Pages 267-271
Keywords TES, Johnson noise, phonon noise, excess noise, flux-flow noise, thermal fluctuation noise
Abstract Microcalorimeters and bolometers are noise-limited devices, therefore, a proper understanding of all noise sources is essential to predict and interpret their performance. In this paper, I review the fundamental noise processes contributing to Transition Edge Sensor (TES) microcalorimeters and bolometers and their effect on device performance. In particular, I will start with a simple, monolithic device model, moving to a more complex one involving discrete components, to finally move to today's more realistic, comprehensive model. In addition to the basic noise contribution (equilibrium Johnson noise and phonon noise), TES are significantly affected by extra noise, which is commonly referred to as excess noise. Different fundamental processes have been proposed and investigated to explain the origin of this excess noise, in particular near equilibrium non-linear Johnson noise, flux-flow noise, and internal thermal fluctuation noise. Experimental evidence shows that all three processes are real and contribute, at different levels, to the TES noise, although different processes become important at different regimes. It is therefore time to discard the term “excess noise” and consider these terms part of the “fundamental noise processes” instead.
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Notes Recommended by Klapwijk Approved no
Call Number Serial 914
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Author Gershenzon, E. M.; Orlov, L. A.; Ptitsina, N. G.
Title Absorption spectra in electron transitions between excited states of impurities in germanium Type Journal Article
Year 1975 Publication JETP Lett. Abbreviated Journal JETP Lett.
Volume 22 Issue (up) 4 Pages 95-97
Keywords Ge, impurities, excited states, absorption spectra
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Notes Approved no
Call Number Serial 1773
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